南方科技大学知识苑(SUSTech KC): Investigation of electrical properties and reliability of gan-based micro-leds

题名	Investigation of electrical properties and reliability of gan-based micro-leds
作者	Zhang，Ke1,2 ; Liu，Yibo 1; Kwok，Hoi Sing 1,2; Liu，Zhaojun1,2
通讯作者	Liu，Zhaojun
发表日期	2020-04-01
DOI	10.3390/nano10040689
发表期刊	Nanomaterials 影响因子和分区
ISSN	2079-4991
EISSN	2079-4991
卷号	10 期号:4
摘要	In this paper, we report high-performance Micro-LEDs on sapphire substrates, with pixel size scaling to 20 µm and an ultra-high current density of 9902 A/cm. The forward voltages (V) of the devices ranged from 2.32 V to 2.39 V under an injection current density of 10 A/cm. The size and structure-dependent effects were subsequently investigated to optimize the device design. The reliability of Micro-LED devices was evaluated under long-aging, high-temperature, and high-humidity conditions. It was found that Micro-LED devices can maintain comparable performance with an emission wavelength of about 445 nm and a full width at half maximum (FWHM) of 22 nm under extreme environments. Following this, specific analysis with four detailed factors of forward voltage, forward current, slope, and leakage current was carried out in order to show the influence of the different environments on different aspects of the devices.
关键词	GaN-based micro-LEDs Micro-LED display Reliability test
相关链接	[Scopus记录]
收录类别	SCI
语种	英语
学校署名	第一 ; 通讯
资助项目	Shenzhen Science and Technology Program[KQTD20170810110313773]
WOS研究方向	Science & Technology - Other Topics ; Materials Science
WOS类目	Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary
WOS记录号	WOS:000539577200092
出版者	MDPI
Scopus记录号	2-s2.0-85083857386
来源库	Scopus
引用统计	被引频次[WOS]：32
成果类型	期刊论文
条目标识符	http://sustech.caswiz.com/handle/2SGJ60CL/138239
专题	工学院_电子与电气工程系
作者单位	1.Department of Electrical and Electronic Engineering,The Southern University of Science and Technology,Shenzhen,518000,China 2.Department of Electronic and Computer Engineering,Hong Kong University of Science and Technology,Hong Kong
第一作者单位	电子与电气工程系
通讯作者单位	电子与电气工程系
第一作者的第一单位	电子与电气工程系
推荐引用方式 GB/T 7714	Zhang，Ke,Liu，Yibo,Kwok，Hoi Sing,et al. Investigation of electrical properties and reliability of gan-based micro-leds[J]. Nanomaterials,2020,10(4).
APA	Zhang，Ke,Liu，Yibo,Kwok，Hoi Sing,&Liu，Zhaojun.(2020).Investigation of electrical properties and reliability of gan-based micro-leds.Nanomaterials,10(4).
MLA	Zhang，Ke,et al."Investigation of electrical properties and reliability of gan-based micro-leds".Nanomaterials 10.4(2020).