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题名

Electronic Structure, Optical Properties, and Photoelectrochemical Activity of Sn-Doped Fe2O3 Thin Films

作者
通讯作者Zhang, K. H. L.
发表日期
2020-06-11
DOI
发表期刊
ISSN
1932-7447
EISSN
1932-7455
卷号124期号:23页码:12548-12558
摘要
Hematite (Fe2O3) is a well-known oxide semiconductor suitable for photoelectrochemical (PEC) water splitting and industry gas sensing. It is widely known that Sn doping of Fe2O3 can enhance the device performance, yet the underlying mechanism remains elusive. In this work, we determine the relationship between electronic structure, optical properties, and PEC activity of Sn-doped Fe2O3 by studying highly crystalline, well-controlled thin films prepared by pulsed laser deposition (PLD). We show that Sn doping substantially increases the n-type conductivity of Fe2O3, and the conduction mechanism is better described by a small-polaron hopping (SPH) model. Only 0.2% Sn doping significantly reduces the activation energy barrier for SPH conduction from at least 0.5 eV for undoped Fe2O3 to 0.14 eV for doped ones. A combination of X-ray photoemission, X-ray absorption spectroscopy, and DFT calculations reveals that the Fermi level gradually shifts toward the conduction band minimum with Sn doping. A localized Fe2+-like gap state is observed at the top of the valence band, accounting for the SPH conduction. Interestingly, different from the literature, only 0.2% Sn doping in Fe2O3 significantly improves the PEC activity, while more Sn decreases it. The improved PEC activity is partially attributed to an increased band bending potential which facilitates the charge separation at the space charge region. The reduced activation energy barrier for SPH will facilitate the transport of photoexcited carriers for the enhanced PEC, which is of interest for further carrier dynamics study.
相关链接[来源记录]
收录类别
SCI ; EI
语种
英语
学校署名
其他
资助项目
EPSRC[EP/L011700/1][EP/N004272/1] ; Royal Academy of Engineering[CiET1819_24] ; National Natural Science Foundation of China[21872116] ; Australian Research Council[FT160100207] ; U.S. Department of Energy (DOE), Office of Science, Office of Basic Energy Sciences, Early Career Research Program[68278]
WOS研究方向
Chemistry ; Science & Technology - Other Topics ; Materials Science
WOS类目
Chemistry, Physical ; Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary
WOS记录号
WOS:000541745800041
出版者
EI入藏号
20202908951485
EI主题词
Optical properties ; X ray absorption spectroscopy ; Calculations ; Activation energy ; Energy gap ; Hematite ; Oxide semiconductors ; Energy barriers ; Electronic structure ; Oxygen vacancies ; Pulsed laser deposition
EI分类号
Minerals:482.2 ; Thermodynamics:641.1 ; Semiconducting Materials:712.1 ; Light/Optics:741.1 ; Laser Applications:744.9 ; Physical Chemistry:801.4 ; Chemical Reactions:802.2 ; Mathematics:921 ; Atomic and Molecular Physics:931.3 ; Crystalline Solids:933.1
来源库
Web of Science
引用统计
被引频次[WOS]:58
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/140675
专题理学院_物理系
作者单位
1.Xiamen Univ, State Key Lab Phys Chem Solid Surfaces, Coll Chem & Chem Engn, Xiamen 361005, Peoples R China
2.Univ Cambridge, Dept Mat Sci & Met, Cambridge CB3 0FS, England
3.Pacific Northwest Natl Lab, Phys & Computat Sci Directorate, Phys Sci Div, Richland, WA 99352 USA
4.Univ Elect Sci & Technol China, Sch Phys, Chengdu 610054, Peoples R China
5.Southern Univ Sci & Technol, Dept Phys, Shenzhen 518055, Guangdong, Peoples R China
6.Queensland Univ Technol, Ctr Mat Sci, Sch Chem & Phys, Brisbane, Qld 4001, Australia
推荐引用方式
GB/T 7714
Tian, C. M.,Li, W-W,Lin, Y. M.,et al. Electronic Structure, Optical Properties, and Photoelectrochemical Activity of Sn-Doped Fe2O3 Thin Films[J]. Journal of Physical Chemistry C,2020,124(23):12548-12558.
APA
Tian, C. M..,Li, W-W.,Lin, Y. M..,Yang, Z. Z..,Wang, L..,...&Zhang, K. H. L..(2020).Electronic Structure, Optical Properties, and Photoelectrochemical Activity of Sn-Doped Fe2O3 Thin Films.Journal of Physical Chemistry C,124(23),12548-12558.
MLA
Tian, C. M.,et al."Electronic Structure, Optical Properties, and Photoelectrochemical Activity of Sn-Doped Fe2O3 Thin Films".Journal of Physical Chemistry C 124.23(2020):12548-12558.
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