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题名

Defect-mediated Rashba engineering for optimizing electrical transport in thermoelectric BiTeI

作者
通讯作者Yang, Jiong; Zhang, Wenqing
发表日期
2020-07-28
DOI
发表期刊
ISSN
2057-3960
EISSN
2057-3960
卷号6期号:1
摘要
The Rashba effect plays a vital role in electronic structures and related functional properties. The strength of the Rashba effect can be measured by the Rashba parameter alpha(R); it is desirable to manipulate alpha(R)to control the functional properties. The current work illustrates how alpha(R)can be systematically tuned by doping, taking BiTeI as an example. A five-point-spin-texture method is proposed to efficiently screen doped BiTeI systems with the Rashba effect. Our results show that alpha(R)in doped BiTeI can be manipulated within the range of 0-4.05 eV angstrom by doping different elements. The dopants change alpha(R)by affecting both the spin-orbit coupling strength and band gap. Some dopants with low atomic masses give rise to unexpected and sizable alpha(R), mainly due to the local strains. The calculated electrical transport properties reveal an optimal alpha(R)range of 2.75-3.55 eV angstrom for maximizing the thermoelectric power factors.alpha(R)thus serves as an effective indicator for high-throughput screening of proper dopants and subsequently reveals a few promising Rashba thermoelectrics. This work demonstrates the feasibility of defect-mediated Rashba engineering for optimizing the thermoelectric properties, as well as for manipulating other spin-related functional properties.
相关链接[来源记录]
收录类别
SCI ; EI
语种
英语
学校署名
通讯
资助项目
National Key Research and Development Program of China[2017YFB0701600][2018YFB0703600] ; Natural Science Foundation of China[51632005][11604200][11674211][51761135127] ; 111 Project[D16002] ; Guangdong Innovation Research Team Project[2017ZT07C062] ; Guangdong Provincial Key-Lab program[2019B030301001] ; Shenzhen Municipal Key-Lab program[ZDSYS20190902092905285] ; US National Science Foundation[1915933]
WOS研究方向
Chemistry ; Materials Science
WOS类目
Chemistry, Physical ; Materials Science, Multidisciplinary
WOS记录号
WOS:000553016600001
出版者
EI入藏号
20203108996008
EI主题词
Energy gap ; Thermoelectric power ; Tellurium compounds ; Textures ; Defects ; Electronic structure
EI分类号
Materials Science:951
来源库
Web of Science
引用统计
被引频次[WOS]:26
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/141341
专题理学院_物理系
量子科学与工程研究院
作者单位
1.Shanghai Univ, Mat Genome Inst, 99 Shangda Rd, Shanghai 200444, Peoples R China
2.Univ Washington, Mat Sci & Engn Dept, Seattle, WA 98195 USA
3.Univ Missouri, Dept Phys & Astron, Columbia, MO 65211 USA
4.Univ Missouri, Dept Chem, Columbia, MO 65211 USA
5.Southern Univ Sci & Technol, Dept Phys, Shenzhen 518055, Guangdong, Peoples R China
6.Southern Univ Sci & Technol, Shenzhen Inst Quantum Sci & Technol, Shenzhen 518055, Guangdong, Peoples R China
7.Southern Univ Sci & Technol, Guangdong Prov Key Lab Computat Sci & Mat Design, Shenzhen 518055, Guangdong, Peoples R China
8.Southern Univ Sci & Technol, Shenzhen Key Lab Adv Quantum Funct Mat & Devices, Shenzhen 518055, Guangdong, Peoples R China
通讯作者单位物理系;  量子科学与工程研究院;  南方科技大学
推荐引用方式
GB/T 7714
Li, Xin,Sheng, Ye,Wu, Lihua,et al. Defect-mediated Rashba engineering for optimizing electrical transport in thermoelectric BiTeI[J]. npj Computational Materials,2020,6(1).
APA
Li, Xin.,Sheng, Ye.,Wu, Lihua.,Hu, Shunbo.,Yang, Jiong.,...&Zhang, Wenqing.(2020).Defect-mediated Rashba engineering for optimizing electrical transport in thermoelectric BiTeI.npj Computational Materials,6(1).
MLA
Li, Xin,et al."Defect-mediated Rashba engineering for optimizing electrical transport in thermoelectric BiTeI".npj Computational Materials 6.1(2020).
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