题名 | Recessed gate Pt-AlGaN/GaN HEMT H-2 sensor |
作者 | |
通讯作者 | Yu, H. |
发表日期 | 2019
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ISSN | 1930-0395
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会议录名称 | |
出版地 | 345 E 47TH ST, NEW YORK, NY 10017 USA
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出版者 | |
摘要 | This work reports on the fabrication and characterization of recessed gate Pt-AlGaN/GaN HEMT H-2 sensor. The device with partially etched AlGaN layer was obtained by cyclic plasma oxidation and selective chemical oxide etching. The recess depth of 12.3 nm and low RMS roughness were measured by AFM and the Pt/AlGaN interface was examined by STEM. The gate recess resulted in a similar to 1 V positive threshold voltage shift and in the reduction of the drain current due to lower 2DEG density in the gate region, as compared to non-recessed sensors. After the gate recess the sensing response increased from 0.4 % to 2.1 % and from 13.2 % to 42.2 % for 5 ppm and 300 ppm H-2 concentration, respectively. A comparison of transient characteristics revealed a 1.7x faster response and 2x faster recovery time of the recessed-gate Pt-HEMT sensor at 250 ppm H-2 concentration as well as low hysteresis. |
关键词 | |
学校署名 | 第一
; 通讯
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语种 | 英语
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相关链接 | [来源记录] |
收录类别 | |
资助项目 | "Research of low cost fabrication of GaN power devices and system integration" research fund[JCYJ20160226192639004]
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WOS研究方向 | Engineering
; Remote Sensing
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WOS类目 | Engineering, Electrical & Electronic
; Remote Sensing
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WOS记录号 | WOS:000534184600305
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来源库 | Web of Science
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引用统计 |
被引频次[WOS]:9
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成果类型 | 会议论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/141508 |
专题 | 工学院_深港微电子学院 工学院_电子与电气工程系 创新创业学院 |
作者单位 | 1.Southern Univ Sci & Technol, SUSTech Sch Microelect, Shenzhen, Peoples R China 2.Southern Univ Sci & Technol, Dept Elect & Elect Engn, Shenzhen, Peoples R China 3.Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai, Peoples R China 4.Southern Univ Sci & Technol, Sch Innovat & Entrepreneurship, Shenzhen, Peoples R China 5.Southern Univ Sci & Technol, Key Lab Generat Semicond 3, Shenzhen, Peoples R China 6.Delft Univ Technol, Dept Microelect, Delft, Netherlands |
第一作者单位 | 深港微电子学院; 电子与电气工程系 |
通讯作者单位 | 深港微电子学院; 南方科技大学 |
第一作者的第一单位 | 深港微电子学院 |
推荐引用方式 GB/T 7714 |
Sokolovskij, R.,Zhang, J.,Zheng, H.,et al. Recessed gate Pt-AlGaN/GaN HEMT H-2 sensor[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2019.
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条目包含的文件 | 条目无相关文件。 |
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