题名 | Noise and detectivity limits in organic shortwave infrared photodiodes with low disorder |
作者 | |
通讯作者 | Ng,Tse Nga |
发表日期 | 2020-12-01
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DOI | |
发表期刊 | |
EISSN | 2397-4621
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卷号 | 4期号:1 |
摘要 | To achieve high detectivity in infrared detectors, it is critical to reduce the device noise. However, for non-crystalline semiconductors, an essential framework is missing to understand and predict the effects of disorder on the dark current. This report presents experimental and modeling studies on the noise current in exemplar organic bulk heterojunction photodiodes, with 10 donor–acceptor combinations spanning wavelength between 800 and 1600 nm. A significant reduction of the noise and higher detectivity were found in devices using non-fullerene acceptors (NFAs) in comparison to those using fullerene derivatives. The low noise in NFA blends was attributed to a sharp drop off in the distribution of bandtail states, as revealed by variable-temperature density-of-states measurements. Taking disorder into account, we developed a general physical model to explain the dependence of thermal noise on the effective bandgap and bandtail spread. The model provides theoretical targets for the maximum detectivity that can be obtained at different detection wavelengths in inherently disordered infrared photodiodes. |
相关链接 | [Scopus记录] |
收录类别 | |
语种 | 英语
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学校署名 | 其他
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Scopus记录号 | 2-s2.0-85088047116
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来源库 | Scopus
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引用统计 |
被引频次[WOS]:66
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成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/141535 |
专题 | 工学院_电子与电气工程系 |
作者单位 | 1.Department of Electrical and Computer Engineering,University of California San Diego,La Jolla,9500 Gilman Drive,92093-0407,United States 2.Department of Electrical and Electronic Engineering,Southern University of Science and Technology,Shenzhen,1088 Xueyuan Avenue,518023,China 3.Center for Optoelectronic Materials and Devices,School of Polymer Science and Engineering,University of Southern Mississippi,Hattiesburg,118 College Drive #5050,39406,United States 4.Samsung Advanced Institute of Technology (SAIT),Samsung Electronics,Co.,Ltd.,Gyeonggi-do,130 Samsung-ro, Yeongtong-gu, Suwon-si,443-803,South Korea |
第一作者单位 | 电子与电气工程系 |
推荐引用方式 GB/T 7714 |
Wu,Zhenghui,Li,Ning,Eedugurala,Naresh,et al. Noise and detectivity limits in organic shortwave infrared photodiodes with low disorder[J]. npj Flexible Electronics,2020,4(1).
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APA |
Wu,Zhenghui,Li,Ning,Eedugurala,Naresh,Azoulay,Jason D.,Leem,Dong Seok,&Ng,Tse Nga.(2020).Noise and detectivity limits in organic shortwave infrared photodiodes with low disorder.npj Flexible Electronics,4(1).
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MLA |
Wu,Zhenghui,et al."Noise and detectivity limits in organic shortwave infrared photodiodes with low disorder".npj Flexible Electronics 4.1(2020).
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条目包含的文件 | 条目无相关文件。 |
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