题名 | 4点曲げ試験による単結晶Siウエハの加工面性状評価 |
作者 | |
发表日期 | 2019
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DOI | |
发表期刊 | |
ISSN | 1346-4930
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卷号 | 19期号:2页码:131-136 |
摘要 | Chemical mechanical polishing (CMP) is one of the effective surface-finishing methods for machining Si wafers. However, the conventional CMP process using free abrasive slurry has apparent disadvantages, such as low efficiency, high environmental burden and cost. As a promising technology for the machining of large-sized Si wafer, chemo-mechanical grinding (CMG) integrates the advantages of fixed abrasive machining and CMP process, and hence can generate superior surface quality comparable to that by CMP while maintaining the high geometric accuracy. In this laboratory, we proposed the ultrasonic assisted chemo-mechanical grinding (UA-CMG) process using fixed abrasive to enhance the material removal rate, attain the work-surface with little damage or defects. Although UA-CMG is effective for the improvement of surface roughness and surface morphologies, machined surface characteristics need to be further investigated. In this paper, the evaluation of machined surface texture (Particularly, tool mark and machining defects) using material testing technique is reported. Four-point bending tests of the single-crystal Si wafer processed using UA-CMG are conducted and the influence of surface texture on mechanical properties has been evaluated. |
关键词 | 進化型多目的マルチタスク最適化手法
親個体選択方法
多目的最適化
evolutionary multiobjective multitasking
parent selection
multiobjective optimization英语演讲
英语辩论
学生投入
大学英语教学 English Public Speaking English Debate Student Engagement College English TeachingMachined surface texture Si wafer Bending test Chemo-mechanical grinding (CMG) Ultrasonic Fracture strength Machining defects |
相关链接 | [万方记录] |
语种 | 日文
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学校署名 | 其他
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来源库 | WanFang
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万方记录号 | 15e3e826eaa2eeecdffd5fa069ce08b9
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引用统计 |
被引频次[WOS]:0
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成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/206085 |
专题 | 人文社会科学学院_语言中心 工学院 |
作者单位 | 1.南方科技大学语言中心,广东 深圳秋田県立大学システム科学技術学部 2.秋田県立大学 3.南方科技大学工学院 4.秋田県立大学 |
推荐引用方式 GB/T 7714 |
Tatsuya FUJII,Takuto MURAKAMI,Yongbo WU,等. 4点曲げ試験による単結晶Siウエハの加工面性状評価[J]. 実験力学,2019,19(2):131-136.
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APA |
Tatsuya FUJII.,Takuto MURAKAMI.,Yongbo WU.,Mitsuyoshi NOMURA.,藤井 達也.,...&野村 光由.(2019).4点曲げ試験による単結晶Siウエハの加工面性状評価.実験力学,19(2),131-136.
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MLA |
Tatsuya FUJII,et al."4点曲げ試験による単結晶Siウエハの加工面性状評価".実験力学 19.2(2019):131-136.
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