题名 | Plasma-based isotropic etching polishing of synthetic quartz |
作者 | |
通讯作者 | Li,Yaguo |
发表日期 | 2020-12-01
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DOI | |
发表期刊 | |
ISSN | 1526-6125
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EISSN | 2212-4616
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卷号 | 60页码:447-456 |
摘要 | To efficiently eliminate the surface defects and subsurface damage layer of synthetic quartz introduced by grinding, a plasma-based isotropic etching polishing (plasma-IEP) technique is proposed in this study. The smoothing of synthetic quartz by plasma-IEP is attributed to the formation, overlapping and merging of numerous and ultra-smooth etch pits formed by isotropic etching of SiO using inductively coupled plasma. Plasma diagnostics have revealed the existence of large amounts of etching radicals. The input radio frequency power and CF flow rate have been proved to be the two determinant factors of the material removal rate (MRR) of plasma-IEP. Under the optimized conditions, a maximum MRR of 5.62 μm/min of a 2-inch wafer has been achieved which is much higher than that of the conventional CMP process. After plasma-IEP for 30 min, the Sa roughness of the ground synthetic quartz decreases from 270.6 nm to 17.4 nm and the inner surface of the isotropic etch pits is smooth at the atomic level. The results presented in this paper demonstrate that plasma-IEP is a promising approach for the highly efficient and damage-free semi-finishing of synthetic quartz. |
关键词 | |
相关链接 | [Scopus记录] |
收录类别 | |
语种 | 英语
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学校署名 | 第一
|
资助项目 | National Natural Science Foundation of China[52035009][52005243]
; research fund for International Cooperation from the Science and Technology Innovation Committee of Shenzhen Municipality[GJHZ20180928155412525]
; Shenzhen High-level Innovation and Entrepreneurship Fund[KQTD20170810110250357]
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WOS研究方向 | Engineering
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WOS类目 | Engineering, Manufacturing
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WOS记录号 | WOS:000595265000001
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出版者 | |
EI入藏号 | 20204609483407
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EI主题词 | Polishing
; Etching
; Inductively coupled plasma
; Plasma diagnostics
; Surface roughness
; Surface defects
|
EI分类号 | Minerals:482.2
; Machining Operations:604.2
; Chemical Reactions:802.2
; Physical Properties of Gases, Liquids and Solids:931.2
; Plasma Physics:932.3
; Materials Science:951
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Scopus记录号 | 2-s2.0-85095776519
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来源库 | Scopus
|
引用统计 |
被引频次[WOS]:13
|
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/209084 |
专题 | 工学院_机械与能源工程系 |
作者单位 | 1.Department of Mechanical and Energy Engineering,Southern University of Science and Technology,Shenzhen,No. 1088, Xueyuan Road,518055,China 2.Fine Optical Engineering Research Centre,Chengdu,610041,China |
第一作者单位 | 机械与能源工程系 |
第一作者的第一单位 | 机械与能源工程系 |
推荐引用方式 GB/T 7714 |
Li,Rulin,Zhang,Yongjie,Zhang,Yi,et al. Plasma-based isotropic etching polishing of synthetic quartz[J]. Journal of Manufacturing Processes,2020,60:447-456.
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APA |
Li,Rulin,Zhang,Yongjie,Zhang,Yi,Liu,Wang,Li,Yaguo,&Deng,Hui.(2020).Plasma-based isotropic etching polishing of synthetic quartz.Journal of Manufacturing Processes,60,447-456.
|
MLA |
Li,Rulin,et al."Plasma-based isotropic etching polishing of synthetic quartz".Journal of Manufacturing Processes 60(2020):447-456.
|
条目包含的文件 | 条目无相关文件。 |
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