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题名

Plasma-based isotropic etching polishing of synthetic quartz

作者
通讯作者Li,Yaguo
发表日期
2020-12-01
DOI
发表期刊
ISSN
1526-6125
EISSN
2212-4616
卷号60页码:447-456
摘要
To efficiently eliminate the surface defects and subsurface damage layer of synthetic quartz introduced by grinding, a plasma-based isotropic etching polishing (plasma-IEP) technique is proposed in this study. The smoothing of synthetic quartz by plasma-IEP is attributed to the formation, overlapping and merging of numerous and ultra-smooth etch pits formed by isotropic etching of SiO using inductively coupled plasma. Plasma diagnostics have revealed the existence of large amounts of etching radicals. The input radio frequency power and CF flow rate have been proved to be the two determinant factors of the material removal rate (MRR) of plasma-IEP. Under the optimized conditions, a maximum MRR of 5.62 μm/min of a 2-inch wafer has been achieved which is much higher than that of the conventional CMP process. After plasma-IEP for 30 min, the Sa roughness of the ground synthetic quartz decreases from 270.6 nm to 17.4 nm and the inner surface of the isotropic etch pits is smooth at the atomic level. The results presented in this paper demonstrate that plasma-IEP is a promising approach for the highly efficient and damage-free semi-finishing of synthetic quartz.
关键词
相关链接[Scopus记录]
收录类别
SCI ; EI
语种
英语
学校署名
第一
资助项目
National Natural Science Foundation of China[52035009][52005243] ; research fund for International Cooperation from the Science and Technology Innovation Committee of Shenzhen Municipality[GJHZ20180928155412525] ; Shenzhen High-level Innovation and Entrepreneurship Fund[KQTD20170810110250357]
WOS研究方向
Engineering
WOS类目
Engineering, Manufacturing
WOS记录号
WOS:000595265000001
出版者
EI入藏号
20204609483407
EI主题词
Polishing ; Etching ; Inductively coupled plasma ; Plasma diagnostics ; Surface roughness ; Surface defects
EI分类号
Minerals:482.2 ; Machining Operations:604.2 ; Chemical Reactions:802.2 ; Physical Properties of Gases, Liquids and Solids:931.2 ; Plasma Physics:932.3 ; Materials Science:951
Scopus记录号
2-s2.0-85095776519
来源库
Scopus
引用统计
被引频次[WOS]:13
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/209084
专题工学院_机械与能源工程系
作者单位
1.Department of Mechanical and Energy Engineering,Southern University of Science and Technology,Shenzhen,No. 1088, Xueyuan Road,518055,China
2.Fine Optical Engineering Research Centre,Chengdu,610041,China
第一作者单位机械与能源工程系
第一作者的第一单位机械与能源工程系
推荐引用方式
GB/T 7714
Li,Rulin,Zhang,Yongjie,Zhang,Yi,et al. Plasma-based isotropic etching polishing of synthetic quartz[J]. Journal of Manufacturing Processes,2020,60:447-456.
APA
Li,Rulin,Zhang,Yongjie,Zhang,Yi,Liu,Wang,Li,Yaguo,&Deng,Hui.(2020).Plasma-based isotropic etching polishing of synthetic quartz.Journal of Manufacturing Processes,60,447-456.
MLA
Li,Rulin,et al."Plasma-based isotropic etching polishing of synthetic quartz".Journal of Manufacturing Processes 60(2020):447-456.
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