题名 | Demolding force dependence on mold surface modifications in UV nanoimprint lithography |
作者 | |
通讯作者 | Cheng,Xing |
发表日期 | 2021-02-15
|
DOI | |
发表期刊 | |
ISSN | 0167-9317
|
EISSN | 1873-5568
|
卷号 | 236 |
摘要 | Nanoimprint lithography (NIL) has attracted broad interests in nano/micropatterning of photonic structures, however, one of the major challenges in NIL is the defect rate due to a large demolding force which causes difficult demolding. In this work, adhesion and friction stresses were obtained from the overall demolding force through measurements of the total demolding force and the geometries of the mold patterns. The friction stress on the sidewalls is generally larger than the adhesion stress between the mold and the resist. In addition, a conformal AlO layer grown via atomic layer deposition was introduced to cover the imprint mold and reduce the surface roughness on the sidewalls. Together with the coating of an anti-adhesion layer for easy mold releasing, both adhesion and friction stresses were reduced, leading to a lower total demolding force compared to the conventional mold with merely a hydrophobic surfactant layer or mold without any surface modification. The results obtained from this work will help the design and optimization of the NIL molds to mitigate the defect rate in UV-NIL. |
关键词 | |
相关链接 | [Scopus记录] |
收录类别 | |
语种 | 英语
|
学校署名 | 第一
; 通讯
|
资助项目 | Shenzhen Science and Technology Innovation Committee for basic science[JCYJ20160301114303878]
; Shenzhen Key Laboratory for Nanoimprint Technology[ZDSYS20140509142721431]
|
WOS研究方向 | Engineering
; Science & Technology - Other Topics
; Optics
; Physics
|
WOS类目 | Engineering, Electrical & Electronic
; Nanoscience & Nanotechnology
; Optics
; Physics, Applied
|
WOS记录号 | WOS:000598523200008
|
出版者 | |
EI入藏号 | 20204709512976
|
EI主题词 | Nanoimprint lithography
; Friction
; Alumina
; Aluminum oxide
; Surface roughness
; Atomic layer deposition
; Molds
|
EI分类号 | Reproduction, Copying:745.2
; Nanotechnology:761
; Inorganic Compounds:804.2
; Coating Techniques:813.1
; Physical Properties of Gases, Liquids and Solids:931.2
; Solid State Physics:933
; Crystal Growth:933.1.2
; Materials Science:951
|
ESI学科分类 | ENGINEERING
|
Scopus记录号 | 2-s2.0-85096217633
|
来源库 | Scopus
|
引用统计 |
被引频次[WOS]:14
|
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/209401 |
专题 | 工学院_材料科学与工程系 |
作者单位 | Shenzhen Key Laboratory for Nanoimprint Technology,Department of Materials Science and Engineering,Southern University of Science and Technology,Shenzhen,518055,China |
第一作者单位 | 材料科学与工程系 |
通讯作者单位 | 材料科学与工程系 |
第一作者的第一单位 | 材料科学与工程系 |
推荐引用方式 GB/T 7714 |
Li,Mingjie,Chen,Yulong,Luo,Wenxin,et al. Demolding force dependence on mold surface modifications in UV nanoimprint lithography[J]. MICROELECTRONIC ENGINEERING,2021,236.
|
APA |
Li,Mingjie,Chen,Yulong,Luo,Wenxin,&Cheng,Xing.(2021).Demolding force dependence on mold surface modifications in UV nanoimprint lithography.MICROELECTRONIC ENGINEERING,236.
|
MLA |
Li,Mingjie,et al."Demolding force dependence on mold surface modifications in UV nanoimprint lithography".MICROELECTRONIC ENGINEERING 236(2021).
|
条目包含的文件 | 条目无相关文件。 |
|
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