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题名

Demolding force dependence on mold surface modifications in UV nanoimprint lithography

作者
通讯作者Cheng,Xing
发表日期
2021-02-15
DOI
发表期刊
ISSN
0167-9317
EISSN
1873-5568
卷号236
摘要
Nanoimprint lithography (NIL) has attracted broad interests in nano/micropatterning of photonic structures, however, one of the major challenges in NIL is the defect rate due to a large demolding force which causes difficult demolding. In this work, adhesion and friction stresses were obtained from the overall demolding force through measurements of the total demolding force and the geometries of the mold patterns. The friction stress on the sidewalls is generally larger than the adhesion stress between the mold and the resist. In addition, a conformal AlO layer grown via atomic layer deposition was introduced to cover the imprint mold and reduce the surface roughness on the sidewalls. Together with the coating of an anti-adhesion layer for easy mold releasing, both adhesion and friction stresses were reduced, leading to a lower total demolding force compared to the conventional mold with merely a hydrophobic surfactant layer or mold without any surface modification. The results obtained from this work will help the design and optimization of the NIL molds to mitigate the defect rate in UV-NIL.
关键词
相关链接[Scopus记录]
收录类别
SCI ; EI
语种
英语
学校署名
第一 ; 通讯
资助项目
Shenzhen Science and Technology Innovation Committee for basic science[JCYJ20160301114303878] ; Shenzhen Key Laboratory for Nanoimprint Technology[ZDSYS20140509142721431]
WOS研究方向
Engineering ; Science & Technology - Other Topics ; Optics ; Physics
WOS类目
Engineering, Electrical & Electronic ; Nanoscience & Nanotechnology ; Optics ; Physics, Applied
WOS记录号
WOS:000598523200008
出版者
EI入藏号
20204709512976
EI主题词
Nanoimprint lithography ; Friction ; Alumina ; Aluminum oxide ; Surface roughness ; Atomic layer deposition ; Molds
EI分类号
Reproduction, Copying:745.2 ; Nanotechnology:761 ; Inorganic Compounds:804.2 ; Coating Techniques:813.1 ; Physical Properties of Gases, Liquids and Solids:931.2 ; Solid State Physics:933 ; Crystal Growth:933.1.2 ; Materials Science:951
ESI学科分类
ENGINEERING
Scopus记录号
2-s2.0-85096217633
来源库
Scopus
引用统计
被引频次[WOS]:14
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/209401
专题工学院_材料科学与工程系
作者单位
Shenzhen Key Laboratory for Nanoimprint Technology,Department of Materials Science and Engineering,Southern University of Science and Technology,Shenzhen,518055,China
第一作者单位材料科学与工程系
通讯作者单位材料科学与工程系
第一作者的第一单位材料科学与工程系
推荐引用方式
GB/T 7714
Li,Mingjie,Chen,Yulong,Luo,Wenxin,et al. Demolding force dependence on mold surface modifications in UV nanoimprint lithography[J]. MICROELECTRONIC ENGINEERING,2021,236.
APA
Li,Mingjie,Chen,Yulong,Luo,Wenxin,&Cheng,Xing.(2021).Demolding force dependence on mold surface modifications in UV nanoimprint lithography.MICROELECTRONIC ENGINEERING,236.
MLA
Li,Mingjie,et al."Demolding force dependence on mold surface modifications in UV nanoimprint lithography".MICROELECTRONIC ENGINEERING 236(2021).
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