题名 | Research on FOPLP package of multi-chip power module |
作者 | |
DOI | |
发表日期 | 2020-09-15
|
ISBN | 978-1-7281-6294-2
|
会议录名称 | |
页码 | 1-6
|
会议日期 | 15-18 Sept. 2020
|
会议地点 | Tønsberg, Norway
|
摘要 | Power devices are developing for the small volume, high performance and modularization. With more and more application scenarios of Brushless Direct Current Motor (BLDC), MOSFET multi-chip module (MCM) is popular with people. However, the conventional wire Bonding and Copper clip welding technology struggles to meet the requirements for the excessive heat accumulation and complex logic problems in MCM. While the above problems can be well solved by using the new Fan out panel level packing(FOPLP) technology for QFN packaging of multi-chip. The traditional welding technology is used at the bottom of the chip, and the copper porous link is used at the top of the chip with low parasitic capacitance, inductance and low Rdson in electrical performance. In respect to thermal management, the ?JC on the top of the chip can be reduced, which has the effect of double-sided heat dissipation. Top Layer interconnection technology is adopted in the packaging scheme, which can have complex circuit layout.This paper mainly describes the technical implementation of this packaging technology, adopting the finite element software to establish a three-dimensional model of a new type of FOPLP and wire welding packaging for MCM. The thermal resistance of different packaging schemes is calculated to confirm the advantages and disadvantages of different schemes by the way of thermal simulation, the internal temperature distribution of different packaging structures and the main influencing factors of the thermal resistance of packaging compared. |
关键词 | |
学校署名 | 其他
|
语种 | 英语
|
相关链接 | [Scopus记录] |
收录类别 | |
EI入藏号 | 20204809545290
|
EI主题词 | Chip scale packages
; Capacitance
; Copper
; Welding
; Microprocessor chips
|
EI分类号 | Construction Methods:405.2
; Welding:538.2
; Copper:544.1
; Electricity: Basic Concepts and Phenomena:701.1
; Semiconductor Devices and Integrated Circuits:714.2
|
Scopus记录号 | 2-s2.0-85096591449
|
来源库 | Scopus
|
全文链接 | https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9229816 |
引用统计 |
被引频次[WOS]:0
|
成果类型 | 会议论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/209568 |
专题 | 南方科技大学 工学院_深港微电子学院 |
作者单位 | 1.FUDAN UNIVERSITY,ACADEMY for ENGINEERINGTECHNOLOGY,Shanghai,China 2.Wuxi Sky Chip Interconnection Technology CO. LTD,Product Research and Development,shenzhen,China 3.Southern University of Science and Technology,Shenzhen Institute of Wide-Bandgap Semiconductors Engineering Research,Center of Integrated Circuits for Next-Generation Communications,Ministry of Education,Shenzhen,China 4.Wuxi Sky Chip Interconnection Technology CO. LTD,R and D Department,Wuxi,China 5.Delft University of Technology,Shenzhen Institute of Wide-Bandgap Semiconductors Electronic Components,Technology and Materials,Delft, CD,2628,Netherlands |
推荐引用方式 GB/T 7714 |
Jiang,Jing,Huo,Jia Ren,Song,Guan Qiang,et al. Research on FOPLP package of multi-chip power module[C],2020:1-6.
|
条目包含的文件 | 条目无相关文件。 |
|
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论