南方科技大学知识苑(SUSTech KC): Energy-Efficient and Error-Resilient Cognitive I/O for 3-D-Integrated Manycore Microprocessors

题名	Energy-Efficient and Error-Resilient Cognitive I/O for 3-D-Integrated Manycore Microprocessors
作者	Sai Manoj，P. D.1; Huang，Hantao 2; Yu，Hao3
通讯作者	Yu，Hao
发表日期	2021-12
DOI	10.1109/MDAT.2020.3043232
发表期刊	IEEE Design & Test 影响因子和分区
ISSN	2168-2364
卷号	38 期号:6页码:88-95
关键词	Random access memory Quality of service Dimensionality reduction Power demand Biometrics (access control) Memory management Three-dimensional displays
相关链接	[IEEE记录]
收录类别	EI ; SCI
学校署名	通讯
EI入藏号	20205209677842
EI主题词	Energy efficiency
EI分类号	Energy Conservation:525.2
来源库	IEEE
全文链接	https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9286723
引用统计	被引频次[WOS]：0
成果类型	期刊论文
条目标识符	http://sustech.caswiz.com/handle/2SGJ60CL/210761
专题	工学院_电子与电气工程系
作者单位	1.Department of Electrical and Computer Engineering, George Mason University, Fairfax, VA 22030 USA. (e-mail: saimanoj.p.2013@ieee.org) 2.Mediatek Singapore. 3.Department of Electrical and Electronic Engineering, Southern University of Science and Technology, Guangdong Sheng, 518055 China.
通讯作者单位	电子与电气工程系
推荐引用方式 GB/T 7714	Sai Manoj，P. D.,Huang，Hantao,Yu，Hao. Energy-Efficient and Error-Resilient Cognitive I/O for 3-D-Integrated Manycore Microprocessors[J]. IEEE Design & Test,2021,38(6):88-95.
APA	Sai Manoj，P. D.,Huang，Hantao,&Yu，Hao.(2021).Energy-Efficient and Error-Resilient Cognitive I/O for 3-D-Integrated Manycore Microprocessors.IEEE Design & Test,38(6),88-95.
MLA	Sai Manoj，P. D.,et al."Energy-Efficient and Error-Resilient Cognitive I/O for 3-D-Integrated Manycore Microprocessors".IEEE Design & Test 38.6(2021):88-95.