题名 | Density functional theory calculation of the properties of carbon vacancy defects in silicon carbide |
作者 | |
通讯作者 | Zhao,Junlei |
发表日期 | 2020-12-01
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DOI | |
发表期刊 | |
ISSN | 1672-6030
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EISSN | 2589-5540
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卷号 | 3期号:4页码:211-217 |
摘要 | As a promisingmaterial for quantumtechnology, silicon carbide (SiC) has attracted great interest inmaterials science. Carbon vacancy is a dominant defect in 4H-SiC. Thus, understanding the properties of this defect is critical to its application, and the atomic and electronic structures of the defects needs to be identified. In this study, density functional theorywas used to characterize the carbon vacancy defects in hexagonal (h) and cubic (k) lattice sites. The zero-phonon line energies, hyperfine tensors, and formation energies of carbon vacancies with different charge states (2, -, 0,+ and 2) in different supercells (72, 128, 400 and 576 atoms)were calculated using standard Perdew-Burke-Ernzerhof and Heyd-Scuseria-Ernzerhof methods. Results show that the zero-phonon line energies of carbon vacancy defects are much lower than those of divacancy defects, indicating that the former is more likely to reach the excited state than the latter. The hyperfine tensors of V(h) and V(k) were calculated. Comparison of the calculated hyperfine tensor with the experimental results indicates the existence of carbon vacancies in SiC lattice. The calculation of formation energy shows that the most stable carbon vacancy defects in the material are V(k), V(k), V(k), V(k) and V(k) as the electronic chemical potential increases. |
关键词 | |
相关链接 | [Scopus记录] |
收录类别 | |
语种 | 英语
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学校署名 | 通讯
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EI入藏号 | 20224112860978
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EI主题词 | Crystal atomic structure
; Defects
; Density functional theory
; Electronic structure
; Excited states
; Phonons
; Tensors
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EI分类号 | Inorganic Compounds:804.2
; Algebra:921.1
; Probability Theory:922.1
; Atomic and Molecular Physics:931.3
; Quantum Theory; Quantum Mechanics:931.4
; Crystal Lattice:933.1.1
; Materials Science:951
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Scopus记录号 | 2-s2.0-85101615580
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来源库 | Scopus
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引用统计 |
被引频次[WOS]:10
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成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/221876 |
专题 | 工学院_电子与电气工程系 |
作者单位 | 1.State Key Laboratory of Precision Measuring Technology & Instruments,Centre of MicroNano Manufacturing Technology,Tianjin University,Tianjin,300072,China 2.Department of Physics and Helsinki Institute of Physics,University of Helsinki,Helsinki,P.O. Box 43,FI-00014,Finland 3.Department of Electrical and Electronic Engineering,Southern University of Science and Technology,Shenzhen,518055,China 4.Fraunhofer Institute for Integrated Systems and Device Technology IISB,Erlangen,Schottkystrasse 10,91058,Germany |
通讯作者单位 | 电子与电气工程系 |
推荐引用方式 GB/T 7714 |
Wang,Xiuhong,Zhao,Junlei,Xu,Zongwei,et al. Density functional theory calculation of the properties of carbon vacancy defects in silicon carbide[J]. Nanotechnology and Precision Engineering,2020,3(4):211-217.
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APA |
Wang,Xiuhong.,Zhao,Junlei.,Xu,Zongwei.,Djurabekova,Flyura.,Rommel,Mathias.,...&Fang,Fengzhou.(2020).Density functional theory calculation of the properties of carbon vacancy defects in silicon carbide.Nanotechnology and Precision Engineering,3(4),211-217.
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MLA |
Wang,Xiuhong,et al."Density functional theory calculation of the properties of carbon vacancy defects in silicon carbide".Nanotechnology and Precision Engineering 3.4(2020):211-217.
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条目包含的文件 | 条目无相关文件。 |
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