中文版 | English
题名

Interfacial interactions during demolding in nanoimprint lithography

作者
通讯作者Li,Mingjie
发表日期
2021-04-01
DOI
发表期刊
EISSN
2072-666X
卷号12期号:4
摘要
Nanoimprint lithography (NIL) is a useful technique for the fabrication of nano/micro-structured materials. This article reviews NIL in the field of demolding processes and is divided into four parts. The first part introduces the NIL technologies for pattern replication with polymer resists (e.g., thermal and UV-NIL). The second part reviews the process simulation during resist filling and demolding. The third and fourth parts discuss in detail the difficulties in demolding, particularly interfacial forces between mold (template) and resist, during NIL which limit its capability for practical commercial applications. The origins of large demolding forces (adhesion and friction forces), such as differences in the thermal expansion coefficients (CTEs) between the template and the imprinted resist, or volumetric shrinkage of the UV-curable polymer during curing, are also illustrated accordingly. The plausible solutions for easing interfacial interactions and optimizing demolding procedures, including exploring new resist materials, employing imprint mold surface modifications (e.g., ALD-assisted conformal layer covering imprint mold), and finetuning NIL process conditions, are presented. These approaches effectively reduce the interfacial demolding forces and thus lead to a lower defect rate of pattern transfer. The objective of this review is to provide insights to alleviate difficulties in demolding and to meet the stringent requirements regarding defect control for industrial manufacturing while at the same time maximizing the throughput of the nanoimprint technique.
关键词
相关链接[Scopus记录]
收录类别
SCI ; EI
语种
英语
学校署名
第一 ; 通讯
资助项目
Department of Science and Technology of Guangdong Province[2020B0101030001] ; Shenzhen Science and Technology Innovation Committee for Shenzhen Key Laboratory for Nanoimprint Technology[ZDSYS20140509142721431]
WOS研究方向
Chemistry ; Science & Technology - Other Topics ; Instruments & Instrumentation ; Physics
WOS类目
Chemistry, Analytical ; Nanoscience & Nanotechnology ; Instruments & Instrumentation ; Physics, Applied
WOS记录号
WOS:000643322600001
出版者
EI入藏号
20211510208095
EI主题词
Atomic layer deposition ; Curing ; Friction ; Molds ; Shrinkage ; Thermal expansion ; Throughput
EI分类号
Nanotechnology:761 ; Chemical Reactions:802.2 ; Solid State Physics:933 ; Crystal Growth:933.1.2 ; Materials Science:951
Scopus记录号
2-s2.0-85103904279
来源库
Scopus
引用统计
被引频次[WOS]:29
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/223751
专题工学院_材料科学与工程系
作者单位
Shenzhen Key Laboratory for Nanoimprint Technology,Department of Materials Science and Engineering,Southern University of Science and Technology,Shenzhen,518055,China
第一作者单位材料科学与工程系
通讯作者单位材料科学与工程系
第一作者的第一单位材料科学与工程系
推荐引用方式
GB/T 7714
Li,Mingjie,Chen,Yulong,Luo,Wenxin,et al. Interfacial interactions during demolding in nanoimprint lithography[J]. Micromachines,2021,12(4).
APA
Li,Mingjie,Chen,Yulong,Luo,Wenxin,&Cheng,Xing.(2021).Interfacial interactions during demolding in nanoimprint lithography.Micromachines,12(4).
MLA
Li,Mingjie,et al."Interfacial interactions during demolding in nanoimprint lithography".Micromachines 12.4(2021).
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