题名 | Interfacial interactions during demolding in nanoimprint lithography |
作者 | |
通讯作者 | Li,Mingjie |
发表日期 | 2021-04-01
|
DOI | |
发表期刊 | |
EISSN | 2072-666X
|
卷号 | 12期号:4 |
摘要 | Nanoimprint lithography (NIL) is a useful technique for the fabrication of nano/micro-structured materials. This article reviews NIL in the field of demolding processes and is divided into four parts. The first part introduces the NIL technologies for pattern replication with polymer resists (e.g., thermal and UV-NIL). The second part reviews the process simulation during resist filling and demolding. The third and fourth parts discuss in detail the difficulties in demolding, particularly interfacial forces between mold (template) and resist, during NIL which limit its capability for practical commercial applications. The origins of large demolding forces (adhesion and friction forces), such as differences in the thermal expansion coefficients (CTEs) between the template and the imprinted resist, or volumetric shrinkage of the UV-curable polymer during curing, are also illustrated accordingly. The plausible solutions for easing interfacial interactions and optimizing demolding procedures, including exploring new resist materials, employing imprint mold surface modifications (e.g., ALD-assisted conformal layer covering imprint mold), and finetuning NIL process conditions, are presented. These approaches effectively reduce the interfacial demolding forces and thus lead to a lower defect rate of pattern transfer. The objective of this review is to provide insights to alleviate difficulties in demolding and to meet the stringent requirements regarding defect control for industrial manufacturing while at the same time maximizing the throughput of the nanoimprint technique. |
关键词 | |
相关链接 | [Scopus记录] |
收录类别 | |
语种 | 英语
|
学校署名 | 第一
; 通讯
|
资助项目 | Department of Science and Technology of Guangdong Province[2020B0101030001]
; Shenzhen Science and Technology Innovation Committee for Shenzhen Key Laboratory for Nanoimprint Technology[ZDSYS20140509142721431]
|
WOS研究方向 | Chemistry
; Science & Technology - Other Topics
; Instruments & Instrumentation
; Physics
|
WOS类目 | Chemistry, Analytical
; Nanoscience & Nanotechnology
; Instruments & Instrumentation
; Physics, Applied
|
WOS记录号 | WOS:000643322600001
|
出版者 | |
EI入藏号 | 20211510208095
|
EI主题词 | Atomic layer deposition
; Curing
; Friction
; Molds
; Shrinkage
; Thermal expansion
; Throughput
|
EI分类号 | Nanotechnology:761
; Chemical Reactions:802.2
; Solid State Physics:933
; Crystal Growth:933.1.2
; Materials Science:951
|
Scopus记录号 | 2-s2.0-85103904279
|
来源库 | Scopus
|
引用统计 |
被引频次[WOS]:29
|
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/223751 |
专题 | 工学院_材料科学与工程系 |
作者单位 | Shenzhen Key Laboratory for Nanoimprint Technology,Department of Materials Science and Engineering,Southern University of Science and Technology,Shenzhen,518055,China |
第一作者单位 | 材料科学与工程系 |
通讯作者单位 | 材料科学与工程系 |
第一作者的第一单位 | 材料科学与工程系 |
推荐引用方式 GB/T 7714 |
Li,Mingjie,Chen,Yulong,Luo,Wenxin,et al. Interfacial interactions during demolding in nanoimprint lithography[J]. Micromachines,2021,12(4).
|
APA |
Li,Mingjie,Chen,Yulong,Luo,Wenxin,&Cheng,Xing.(2021).Interfacial interactions during demolding in nanoimprint lithography.Micromachines,12(4).
|
MLA |
Li,Mingjie,et al."Interfacial interactions during demolding in nanoimprint lithography".Micromachines 12.4(2021).
|
条目包含的文件 | 条目无相关文件。 |
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