题名 | Recent progress on kinetic control of chemical vapor deposition growth of high-quality wafer-scale transition metal dichalcogenides |
作者 | |
通讯作者 | Cheng, Chun |
发表日期 | 2021-05-01
|
DOI | |
发表期刊 | |
ISSN | 2516-0230
|
卷号 | 3页码:3430-3440 |
摘要 | 2D transition metal dichalcogenides (TMDs) have attracted significant attention due to their unique physical properties. Chemical vapor deposition (CVD) is generally a promising method to prepare ideal TMD films with high uniformity, large domain size, good single-crystallinity, etc., at wafer-scale for commercial uses. However, the CVD-grown TMD samples often suffer from poor quality due to the improper control of reaction kinetics and lack of understanding about the phenomenon. In this review, we focus on several key challenges in the controllable CVD fabrication of high-quality wafer-scale TMD films and highlight the importance of the control of precursor concentration, nucleation density, and oriented growth. The remaining difficulties in the field and prospective directions of the related topics are further summarized. |
相关链接 | [来源记录] |
收录类别 | |
语种 | 英语
|
学校署名 | 第一
; 通讯
|
资助项目 | National Natural Science Foundation of China[51776094,91963129]
; Foundation of Shenzhen Science and Technology Innovation Committee[JCYJ20180302174021198]
; Basic Research Project of Science and Technology Plan of Shenzhen[JCYJ20180504165655180]
|
WOS研究方向 | Chemistry
; Science & Technology - Other Topics
; Materials Science
|
WOS类目 | Chemistry, Multidisciplinary
; Nanoscience & Nanotechnology
; Materials Science, Multidisciplinary
|
WOS记录号 | WOS:000656979500001
|
出版者 | |
EI入藏号 | 20212510520378
|
EI主题词 | Crystallinity
; Quality control
; Reaction kinetics
; Transition metals
|
EI分类号 | Metallurgy and Metallography:531
; Chemical Reactions:802.2
; Quality Assurance and Control:913.3
|
来源库 | Web of Science
|
引用统计 |
被引频次[WOS]:24
|
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/229427 |
专题 | 工学院_材料科学与工程系 |
作者单位 | 1.Southern Univ Sci & Technol, Dept Mat Sci & Engn, Shenzhen 518055, Peoples R China 2.Hong Kong Univ Sci & Technol, Dept Phys, Hong Kong, Peoples R China 3.Hong Kong Univ Sci & Technol, Ctr Quantum Mat, Hong Kong, Peoples R China 4.Western Sydney Univ, Ctr Infrastruct Engn, Kingswood, NSW 2751, Australia |
第一作者单位 | 材料科学与工程系 |
通讯作者单位 | 材料科学与工程系 |
第一作者的第一单位 | 材料科学与工程系 |
推荐引用方式 GB/T 7714 |
Wang, Qun,Shi, Run,Zhao, Yaxuan,et al. Recent progress on kinetic control of chemical vapor deposition growth of high-quality wafer-scale transition metal dichalcogenides[J]. Nanoscale Advances,2021,3:3430-3440.
|
APA |
Wang, Qun.,Shi, Run.,Zhao, Yaxuan.,Huang, Runqing.,Wang, Zixu.,...&Cheng, Chun.(2021).Recent progress on kinetic control of chemical vapor deposition growth of high-quality wafer-scale transition metal dichalcogenides.Nanoscale Advances,3,3430-3440.
|
MLA |
Wang, Qun,et al."Recent progress on kinetic control of chemical vapor deposition growth of high-quality wafer-scale transition metal dichalcogenides".Nanoscale Advances 3(2021):3430-3440.
|
条目包含的文件 | 条目无相关文件。 |
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