Vaite: a Visualization-Assisted Interactive Big Urban Trajectory Data Exploration System

Yang, Chuang1,2; Zhang, Yilan3; Tang, Bo1,2; Zhu, Min3

10.1109/ICDE.2019.00233

2019

1084-4627

978-1-5386-7475-8

2019 IEEE 35TH INTERNATIONAL CONFERENCE ON DATA ENGINEERING (ICDE 2019)

2019-April

2036-2039

8-11 April 2019

Macau, China

345 E 47TH ST, NEW YORK, NY 10017 USA

IEEE

Big urban trajectory exploration extracts insights from trajectories. It has many smart-city applications, e.g., traffic jam detection, taxi movement pattern analysis. The challenges of big urban trajectory data exploration are: (i) the data analysts probably do not have experience or knowledge on issuing their analysis tasks by SQL-like queries or analysis operations accurately; and (ii) big urban trajectory data is naturally complex, e.g., unpredictability, interrelation, etc. In this work, we architect and implement a visualization-assisted big urban trajectory data exploration system (Vaite) to address these chanllenges. Vaite includes three layers, from data collection to results visualization. We devise novel visualization views in Vaite to support interactive big urban trajectory exploratory analysis. We demonstrate the effectiveness of Vaite by the real world applications.

trajectory data exploration data visualization

第一 ; 通讯

英语

CPCI-S ; EI

PCL Future Regional Network Facilities for Large-scale Experiments and Applications[PCL2018KP001]

Computer Science

Computer Science, Information Systems

WOS:000477731600226

20192607118297

Taxicabs ; Traffic congestion ; Trajectories ; Visualization

Automobiles:662.1 ; Data Processing and Image Processing:723.2

Web of Science

1.Southern Univ Sci & Technol, Dept Comp Sci & Engn, Shenzhen, Peoples R China
2.Peng Cheng Lab, PCL Res Ctr Networks & Commun, Shenzhen, Peoples R China
3.Sichuan Univ, Coll Comp Sci, Chengdu, Sichuan, Peoples R China

Yang, Chuang,Zhang, Yilan,Tang, Bo,et al. Vaite: a Visualization-Assisted Interactive Big Urban Trajectory Data Exploration System[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2019:2036-2039.