题名 | An Absolute Capacitive Pressure Sensor Based on a SiMiT-Fabricated Vacuum Cavity |
作者 | |
DOI | |
发表日期 | 2021-06-20
|
会议名称 | 21st International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers)
|
ISSN | 2167-0013
|
EISSN | 2167-0021
|
ISBN | 978-1-6654-4845-1
|
会议录名称 | |
页码 | 1170-1173
|
会议日期 | JUN 20-25, 2021
|
会议地点 | null,null,ELECTR NETWORK
|
出版地 | 345 E 47TH ST, NEW YORK, NY 10017 USA
|
出版者 | |
摘要 | Requiring no etching of a sacrificial layer and allowing the use of conventional aluminum metallization, a simple fabrication process based on the silicon-migration technology (SiMiT) conducted in hydrogen is employed in the construction of a sealed vacuum cavity separating a thin silicon diaphragm from a rigid substrate. With the pressure-deformable diaphragm serving as a dielectrically insulated electrode, the cavity providing an absolute reference pressure and the substrate forming a counter-electrode, the combination makes a capacitive absolute pressure sensor. A prototype sensor has been demonstrated, exhibiting a sensitivity of 2.3 aF/Pa. |
关键词 | |
学校署名 | 其他
|
语种 | 英语
|
相关链接 | [Scopus记录] |
收录类别 | |
WOS研究方向 | Engineering
; Instruments & Instrumentation
|
WOS类目 | Engineering, Electrical & Electronic
; Instruments & Instrumentation
|
WOS记录号 | WOS:000707041600304
|
EI入藏号 | 20213810908543
|
EI主题词 | Actuators
; Capacitive sensors
; Electrodes
; Etching
; Fabrication
; Microsystems
; Pressure sensors
; Substrates
|
EI分类号 | Control Devices:732
; Chemical Reactions:802.2
; Pressure Measuring Instruments:944.3
|
Scopus记录号 | 2-s2.0-85114962492
|
来源库 | Scopus
|
全文链接 | https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9495734 |
引用统计 |
被引频次[WOS]:0
|
成果类型 | 会议论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/245959 |
专题 | 南方科技大学 工学院_深港微电子学院 |
作者单位 | 1.Hong Kong University of Science and Technology,Hong Kong,Hong Kong 2.Southern University of Science and Technology,China |
第一作者单位 | 南方科技大学 |
推荐引用方式 GB/T 7714 |
Hu,Yushen,Wang,Fei,Wong,Man. An Absolute Capacitive Pressure Sensor Based on a SiMiT-Fabricated Vacuum Cavity[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2021:1170-1173.
|
条目包含的文件 | 条目无相关文件。 |
|
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论