南方科技大学知识苑(SUSTech KC): Correlations of Ionic Migration and Deep-Level Traps Leads to Surface Defect Formation in Perovskite Solar Cells

题名	Correlations of Ionic Migration and Deep-Level Traps Leads to Surface Defect Formation in Perovskite Solar Cells
作者	Zheng，Xue 1; Wang，Xiao 1; Li，Weimin 1; Liu，Zhenghao1,2 ; Ming，Wenjie 1,3; Wang，Huan 1; Wang，Han 4; Li，Da 4; Liu，Bo 1; Yang，Chunlei 1
发表日期	2021
DOI	10.1021/acs.jpcc.1c05519
发表期刊	Journal of Physical Chemistry C 影响因子和分区
ISSN	1932-7447
EISSN	1932-7455
卷号	125 期号:35页码:19551-19559
摘要	Correlations between ion migration, charge carrier, and bulk deep-level defect in MAPbI3 perovskites are systematically invesitgated through voltage-dependent thermal admittance spectroscopy and in situ scanning probe microscopy. We show that iodine interstitials construct stable, deep-level bulk defects in the polycrystalline MAPbI3 with an activation energy (EA) level of 0.495 eV above the valence band maximum. Experimentally, EA varied with depletion region distribution and excess electron from charge transport layers, which can be modulated through external bias. Under forward bias, mobile bulk defects migrate and transform into surface defect states, introducing additional nonradiative recombination pathways. Overall, this study directly reveals electronic correlations between defect ions and charge carriers, pointing out the importance of iodine defect chemistry in surface recombination and degradation in long-term device stabilities.
相关链接	[Scopus记录]
收录类别	SCI ; EI
语种	英语
学校署名	其他
资助项目	National Natural Science Foundation of China[52003288,61774164,22003074] ; National Key R&D Program of China[2018YFB1500200] ; Shenzhen Science and Technology Program["JCYJ20200109114801744","JCYJ20190807161001747"]
WOS研究方向	Chemistry ; Science & Technology - Other Topics ; Materials Science
WOS类目	Chemistry, Physical ; Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary
WOS记录号	WOS:000696175400052
出版者	AMER CHEMICAL SOC
EI入藏号	20213710886134
EI主题词	Activation energy ; Carrier mobility ; Iodine ; Perovskite ; Scanning probe microscopy ; Surface defects
EI分类号	Minerals:482.2 ; Semiconducting Materials:712.1 ; Chemistry:801 ; Chemical Products Generally:804 ; Materials Science:951
Scopus记录号	2-s2.0-85114627836
来源库	Scopus
引用统计	被引频次[WOS]：12
成果类型	期刊论文
条目标识符	http://sustech.caswiz.com/handle/2SGJ60CL/245998
专题	工学院_材料科学与工程系
作者单位	1.Shenzhen Institutes of Advanced Technology,Chinese Academy of Sciences,Shenzhen,518055,China 2.Department of Materials Science and Engineering,Southern University of Science and Technology,Shenzhen,Guangdong,518055,China 3.Key Laboratory of Low Dimensional Materials and Application Technology of Ministry of Education,School of Materials Science and Engineering,Xiangtan University,Xiangtan,Hunan,411105,China 4.State Key Laboratory of Superhard Materials,College of Physics,Jilin University,Changchun,130012,China
推荐引用方式 GB/T 7714	Zheng，Xue,Wang，Xiao,Li，Weimin,et al. Correlations of Ionic Migration and Deep-Level Traps Leads to Surface Defect Formation in Perovskite Solar Cells[J]. Journal of Physical Chemistry C,2021,125(35):19551-19559.
APA	Zheng，Xue.,Wang，Xiao.,Li，Weimin.,Liu，Zhenghao.,Ming，Wenjie.,...&Yang，Chunlei.(2021).Correlations of Ionic Migration and Deep-Level Traps Leads to Surface Defect Formation in Perovskite Solar Cells.Journal of Physical Chemistry C,125(35),19551-19559.
MLA	Zheng，Xue,et al."Correlations of Ionic Migration and Deep-Level Traps Leads to Surface Defect Formation in Perovskite Solar Cells".Journal of Physical Chemistry C 125.35(2021):19551-19559.