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题名

A Chip-Area-Efficient Subthreshold CMOS Voltage Reference with High PSRR Based on Compensated. VGS of NMOS Transistors

作者
通讯作者Lei, Yu
发表日期
2018
会议录名称
页码
497-500
出版地
345 E 47TH ST, NEW YORK, NY 10017 USA
出版者
摘要
A chip-area-efficient subthreshold CMOS voltage reference (CVR) with low power consumption and high power supply ripple rejection (PSRR) based on compensated. VGS of NMOS transistors is proposed in this paper. The. VGS of two different-Vth NMOS transistors is designed to achieve zero temperature coefficient (TC) by compensating its complementary -to-absolute-temperature (CTAT) and proportional-to-absolute-temperature (PTAT) components. An error amplifier driving a current mirror is then used to duplicate the generated zero-TC. VGS to a diode-connected NMOS and provide the low-TC V-REF. Only two branches are needed in the core part and no resistors are used. Consequently, low power and small area consumptions are achieved with high PSRR. A prototype design is fabricated in a standard 0.18-mu m CMOS process. An average TC of 27.26 ppm/degrees C is measured across 6 dies with a standard derivation of 16.40 ppm/degrees C over -40 to 80 degrees C temperature range. The measured line sensitivity is 0.12%/V. The measured PSRR is better than -62.7dB from 10 kHz to 10 MHz. The power consumption is as small as 17.3nW and the chip area is only 0.0244mm(2).
关键词
学校署名
第一 ; 通讯
语种
英语
相关链接[来源记录]
收录类别
资助项目
Shenzhen Science and Technology Innovation Committee (STSTI)[JCYJ20160530191008447]
WOS研究方向
Engineering
WOS类目
Engineering, Electrical & Electronic
WOS记录号
WOS:000458319800121
来源库
Web of Science
引用统计
被引频次[WOS]:2
成果类型会议论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/24608
专题南方科技大学
工学院_深港微电子学院
作者单位
Southern Univ Sci & Technol SUSTech, Dept EEE, Shenzhen, Peoples R China
第一作者单位南方科技大学
通讯作者单位南方科技大学
第一作者的第一单位南方科技大学
推荐引用方式
GB/T 7714
Lei, Yu,Zhan, Chenchang,Huang, Chenyu,et al. A Chip-Area-Efficient Subthreshold CMOS Voltage Reference with High PSRR Based on Compensated. VGS of NMOS Transistors[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2018:497-500.
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