题名 | The enhancement mode AlGaN/GaN high electron mobility transistor based on charge storage |
作者 | |
通讯作者 | Yu, Hongyu |
DOI | |
发表日期 | 2017
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ISSN | 2162755X
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ISBN | 978-1-5090-6626-1
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会议录名称 | |
卷号 | 2017-October
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页码 | 662-665
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会议日期 | 25-28 Oct. 2017
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会议地点 | Guiyang, China
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出版地 | 345 E 47TH ST, NEW YORK, NY 10017 USA
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出版者 | |
摘要 | In this paper, we sums up our resent progress on the enhancement-mode (E-mode) AlGaN/GaN high electron mobility transistors (HEMTs) which are based on charge storage, including the split floating gates (FGs) HEMT and the one with oxide-SiN-oxide (ONO) gate dielectrics stack. For the FGs HEMT, the V-th variation with the polarization charge density, the density of two dimensional electron gas, the tunnel dielectric thickness, the blocking dielectric thickness, the length and isolating spacing of FGs are presented. The reliability of the FGs HEMT are also revealed. For the HEMT with ONO gate dielectrics stack, the E-mode is realized by negative charge storage within the SiN trap layer. The V-th variation with the programming condition and the thickness of the dielectrics are presented. Under proper programming voltage and time, the V-th can be increased to more than 2V Moreover, it is found that the breakdown voltage of such HEMT can be adjusted by varying the gate dielectric stacks. |
关键词 | |
学校署名 | 第一
; 通讯
|
语种 | 英语
|
相关链接 | [来源记录] |
收录类别 | |
资助项目 | Research of AlGaN HEMT MEMS sensor for work in extreme environment[JCYJ20170412153356899]
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WOS研究方向 | Engineering
; Telecommunications
|
WOS类目 | Engineering, Electrical & Electronic
; Telecommunications
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WOS记录号 | WOS:000426983400166
|
EI入藏号 | 20181404981236
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EI主题词 | Aluminum gallium nitride
; Dielectric materials
; Electron gas
; Electron mobility
; Gallium nitride
; Gate dielectrics
; III-V semiconductors
; Silicon nitride
; Transistors
; Two dimensional electron gas
; Wide band gap semiconductors
|
EI分类号 | Dielectric Materials:708.1
; Semiconducting Materials:712.1
; Semiconductor Devices and Integrated Circuits:714.2
; Inorganic Compounds:804.2
|
来源库 | Web of Science
|
全文链接 | https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8252562 |
引用统计 |
被引频次[WOS]:0
|
成果类型 | 会议论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/24762 |
专题 | 工学院_电子与电气工程系 |
作者单位 | 1.Southern Univ Sci & Technol, Dept Elect & Elect Engn, 1088 Xueyuan Rd, Shenzhen 518055, Guangdong, Peoples R China 2.Southeast Univ, Sch Elect Sci & Engn, 2 Sipailou Rd, Nanjing 210096, Jiangsu, Peoples R China 3.Shenzhen Key Laborary Third Generat Semicond, 1088 Xueyuan Rd, Shenzhen 518055, Guangdong, Peoples R China |
第一作者单位 | 电子与电气工程系 |
通讯作者单位 | 电子与电气工程系 |
第一作者的第一单位 | 电子与电气工程系 |
推荐引用方式 GB/T 7714 |
Wang, Hui,Jiang, Lingli,Wang, Ning,et al. The enhancement mode AlGaN/GaN high electron mobility transistor based on charge storage[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2017:662-665.
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条目包含的文件 | 条目无相关文件。 |
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