中文版 | English
题名

The enhancement mode AlGaN/GaN high electron mobility transistor based on charge storage

作者
通讯作者Yu, Hongyu
DOI
发表日期
2017
ISSN
2162755X
ISBN
978-1-5090-6626-1
会议录名称
卷号
2017-October
页码
662-665
会议日期
25-28 Oct. 2017
会议地点
Guiyang, China
出版地
345 E 47TH ST, NEW YORK, NY 10017 USA
出版者
摘要
In this paper, we sums up our resent progress on the enhancement-mode (E-mode) AlGaN/GaN high electron mobility transistors (HEMTs) which are based on charge storage, including the split floating gates (FGs) HEMT and the one with oxide-SiN-oxide (ONO) gate dielectrics stack. For the FGs HEMT, the V-th variation with the polarization charge density, the density of two dimensional electron gas, the tunnel dielectric thickness, the blocking dielectric thickness, the length and isolating spacing of FGs are presented. The reliability of the FGs HEMT are also revealed. For the HEMT with ONO gate dielectrics stack, the E-mode is realized by negative charge storage within the SiN trap layer. The V-th variation with the programming condition and the thickness of the dielectrics are presented. Under proper programming voltage and time, the V-th can be increased to more than 2V Moreover, it is found that the breakdown voltage of such HEMT can be adjusted by varying the gate dielectric stacks.
关键词
学校署名
第一 ; 通讯
语种
英语
相关链接[来源记录]
收录类别
资助项目
Research of AlGaN HEMT MEMS sensor for work in extreme environment[JCYJ20170412153356899]
WOS研究方向
Engineering ; Telecommunications
WOS类目
Engineering, Electrical & Electronic ; Telecommunications
WOS记录号
WOS:000426983400166
EI入藏号
20181404981236
EI主题词
Aluminum gallium nitride ; Dielectric materials ; Electron gas ; Electron mobility ; Gallium nitride ; Gate dielectrics ; III-V semiconductors ; Silicon nitride ; Transistors ; Two dimensional electron gas ; Wide band gap semiconductors
EI分类号
Dielectric Materials:708.1 ; Semiconducting Materials:712.1 ; Semiconductor Devices and Integrated Circuits:714.2 ; Inorganic Compounds:804.2
来源库
Web of Science
全文链接https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8252562
引用统计
被引频次[WOS]:0
成果类型会议论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/24762
专题工学院_电子与电气工程系
作者单位
1.Southern Univ Sci & Technol, Dept Elect & Elect Engn, 1088 Xueyuan Rd, Shenzhen 518055, Guangdong, Peoples R China
2.Southeast Univ, Sch Elect Sci & Engn, 2 Sipailou Rd, Nanjing 210096, Jiangsu, Peoples R China
3.Shenzhen Key Laborary Third Generat Semicond, 1088 Xueyuan Rd, Shenzhen 518055, Guangdong, Peoples R China
第一作者单位电子与电气工程系
通讯作者单位电子与电气工程系
第一作者的第一单位电子与电气工程系
推荐引用方式
GB/T 7714
Wang, Hui,Jiang, Lingli,Wang, Ning,et al. The enhancement mode AlGaN/GaN high electron mobility transistor based on charge storage[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2017:662-665.
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