A Low-Complexity Fast-Locking Digital PLL With Multi-Output Bang-Bang Phase Detector

Huang, Qiwei1,2; Zhan, Chenchang1; Burm, Jinwook2; IEEE

10.1109/APCCAS.2016.7803991

2016

978-1-5090-1571-9

2016 IEEE ASIA PACIFIC CONFERENCE ON CIRCUITS AND SYSTEMS (APCCAS)

418-420

25-28 Oct. 2016

Jeju, Korea, Republic of

345 E 47TH ST, NEW YORK, NY 10017 USA

IEEE

This paper presents a locking-accelerated DPLL based on multi-output bang-bang phase detector (MOBBPD) with reused most significant hits (MSBs). The hang-hang structure has simple implementation by eliminating the sensitive time-to-digital converter (TDC), while MOBBPD allows for reduced loop locking-time due to the multi-output. To further accelerate the loop locking, a scheme of reusing the MSBs is proposed to signify the large phase-difference at the early stage of lock acquisition, hence reducing the phase difference quickly. The low complexity of the design is maintained due to the simple structure. The proposed DPLL is designed using a 0.18-mu m CMOS process. It generates an output clock frequency range of 1-2.2 GHz with 7.8-17.2 MHz input reference frequency. The power consumption is 5.1 mW while the locking speed is improved by around 20 times improvement compared to without reusing the MSBs.

Digital PLL (DPLL) bang-bang phase detector (BBPD) DCO TDC-less multi-output hang-hang phase detector (MOBBPD)

第一 ; 通讯

英语

CPCI-S ; EI

Engineering

Engineering, Electrical & Electronic

WOS:000392651200109

20170603321714

Frequency converters ; Locks (fasteners) ; Phase locked loops ; Signal detection

Electronic Circuits Other Than Amplifiers, Oscillators, Modulators, Limiters, Discriminators or Mixers:713.5 ; Information Theory and Signal Processing:716.1

Web of Science

1.Southern Univ Sci & Technol, Dept Elect & Elect Engn, Shenzhen, Peoples R China
2.Sogang Univ, Dept Elect Engn, Seoul, South Korea

Huang, Qiwei,Zhan, Chenchang,Burm, Jinwook,et al. A Low-Complexity Fast-Locking Digital PLL With Multi-Output Bang-Bang Phase Detector[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2016:418-420.