题名 | Combining Parametric and Nonparametric Topic Model to Discover Microblog Event |
作者 | |
通讯作者 | Cheng, Ruzhong |
DOI | |
发表日期 | 2014
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会议录名称 | |
卷号 | 3
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页码 | 1526-+
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会议地点 | Sapporo City, Hokkaido, Japan
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出版地 | 345 E 47TH ST, NEW YORK, NY 10017 USA
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出版者 | |
摘要 | Compared with traditional news media, microblog holds overwhelming superiority in fast-diffusion and comprehensive coverage of topics. Microblog becomes an effective, particular and important carrier of affair information and many other text analysis tasks, e.g., event discovering based on microblog have special significance. Common tools of content analysis, such as topic model, however, experience severe data sparsity problems due to short length of microblog. Following previous researchers' idea, such as separating personal interest post from global event post, we further differentiate general topics from event topics and adopt nonparametric method to model the birth and death of event. We conduct experiments on Twitter data set, and the experimental results demonstrate that our method can not only discover event effectively, but also mine higher quality general topics. |
关键词 | |
学校署名 | 其他
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语种 | 英语
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相关链接 | [来源记录] |
收录类别 | |
资助项目 | Shenzhen Gov Projects[JCYJ20130331144541058]
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WOS研究方向 | Computer Science
; Engineering
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WOS类目 | Computer Science, Information Systems
; Engineering, Electrical & Electronic
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WOS记录号 | WOS:000349679700326
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EI入藏号 | 20144900293360
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EI主题词 | Electronics engineering
; Electronics industry
; Mathematical techniques
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EI分类号 | Electrical Engineering, General:709
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来源库 | Web of Science
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引用统计 |
被引频次[WOS]:0
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成果类型 | 会议论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/25016 |
专题 | 工学院_电子与电气工程系 |
作者单位 | 1.Peking Univ, Sch Elect & Comp Engn, Shenzhen Key Lab Cloud Comp Technol & Applicat SP, Shenzhen 518055, Peoples R China 2.South Univ Sci & Technol China, Dept Elect & Comp Engn, Shenzhen 518055, Peoples R China |
推荐引用方式 GB/T 7714 |
Liu, Shengbing,Liu, Li,Cheng, Ruzhong,et al. Combining Parametric and Nonparametric Topic Model to Discover Microblog Event[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2014:1526-+.
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条目包含的文件 | 条目无相关文件。 |
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