Data-Assisted Channel Estimation for Uplink Massive MIMO Systems

Wang, Rui1; Chen, Yifan1; Tan, Haisheng2

10.1109/GLOCOM.2014.7037394

2014

2334-0983

2014 IEEE GLOBAL COMMUNICATIONS CONFERENCE (GLOBECOM 2014)

3766-3771

Austin, TX, United states

345 E 47TH ST, NEW YORK, NY 10017 USA

IEEE

A novel data- assisted channel estimation scheme is proposed for uplink massive multiple- input multiple- output ( MIMO) systems to alleviate the performance bottleneck due to pilot contamination. Specifically, the uplink resource within a fading block is first divided into a number of data blocks, which are encoded respectively; then the detected data blocks are utilized iteratively to refine the channel estimation, improving the signal- to- interference- plus- noise ratio ( SINR) of the following data blocks. In the existing literature, the system performance can not scale up with the number of base station's antenna due to the effect of pilot contamination. The proposed scheme provides a promising approach to improve the uplink SINR by the order Theta(LM/L + M) without increasing the length of pilot sequence, where L and M are the number of transmission symbols within a fading block and the number of base station's antennas respectively. It is shown by simulations that the uplink performance of massive MIMO systems is significantly increased by the proposed scheme.

第一 ; 通讯

英语

CPCI-S ; EI

Computer Science ; Engineering ; Telecommunications

Computer Science, Theory & Methods ; Engineering, Electrical & Electronic ; Telecommunications

WOS:000380919400334

20151100632703

Antennas ; Base stations ; MIMO systems ; Signal interference ; Signal to noise ratio

Information Theory and Signal Processing:716.1 ; Radio Systems and Equipment:716.3

Web of Science

1.South Univ Sci & Technol China, Dept Elect & Elect Engn, Shenzhen, Guangdong, Peoples R China
2.Jinan Univ, Dept Comp Sci, Guangzhou, Guangdong, Peoples R China

Wang, Rui,Chen, Yifan,Tan, Haisheng. Data-Assisted Channel Estimation for Uplink Massive MIMO Systems[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2014:3766-3771.