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题名

Influence of the metallic electrodes on the contact resistance of the ink-jet printed In-Ga-Zn oxide TFTs

作者
通讯作者Dai, H. T.
DOI
发表日期
2013
ISSN
0277-786X
EISSN
1996-756X
会议录名称
卷号
8626
会议地点
San Francisco, CA, United states
出版地
1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA
出版者
摘要
The influence of the metallic electrode materials on the contact resistance of the ink-jet printed In-Ga-Zn oxide (IGZO) thin film transistors (TFTs) is investigated in this paper. Various electrodes, including Al, Ti/Au, ITO and Au were examined based on the inverted staggered (bottom gate top contact) IGZO TFTs. Without additional annealing, the contact resistance increased with the increase of the work function of the electrode, which is Al < Ti/Au < ITO < Au. However, the contact resistance behavior changed drastically for different electrodes under different annealing temperature from 200 to 500 degrees C. The different behavior of the electrodes upon annealing was regarded to the contact modes changed between ohmic and Schottky contact. The finding provides a clue for electrode selection for the ink-jet printed IGZO TFTs to minimize the contact resistance and optimize the device performance according to the process conditions.
关键词
学校署名
其他
语种
英语
相关链接[来源记录]
收录类别
资助项目
National Natural Science Foundation of China (NSFC)[61177014]
WOS研究方向
Materials Science ; Optics
WOS类目
Materials Science, Multidisciplinary ; Optics
WOS记录号
WOS:000325342500037
EI入藏号
20132216383547
EI主题词
Annealing ; Contact resistance ; Electrodes ; Gallium alloys ; Gallium compounds ; Indium alloys ; Ink ; Ink jet printers ; Semiconducting indium compounds ; Ternary alloys ; Thin film circuits ; Thin films ; Zinc alloys
EI分类号
Heat Treatment Processes:537.1 ; Zinc and Alloys:546.3 ; Nonferrous Metals and Alloys excluding Alkali and Alkaline Earth Metals:549.3 ; Electricity: Basic Concepts and Phenomena:701.1 ; Compound Semiconducting Materials:712.1.2 ; Semiconductor Devices and Integrated Circuits:714.2 ; Printing Equipment:745.1.1 ; Chemical Products Generally:804
来源库
Web of Science
引用统计
被引频次[WOS]:1
成果类型会议论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/25041
专题工学院_电子与电气工程系
作者单位
1.Tianjin Univ, Sch Sci, Tianjin Key Lab Low Dimens Mat Phys & Preparing T, Tianjin 300072, Peoples R China
2.Singapore Univ Technol & Design, Pillar Engn Prod Dev, Singapore 138682, Singapore
3.South Univ Sci & Technol, Dept Elect & Comp Engn, Shenzhen, Guangdong, Peoples R China
推荐引用方式
GB/T 7714
Han, Y.,Wang, Y.,Dai, H. T.,et al. Influence of the metallic electrodes on the contact resistance of the ink-jet printed In-Ga-Zn oxide TFTs[C]. 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA:SPIE-INT SOC OPTICAL ENGINEERING,2013.
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