题名 | Influence of the metallic electrodes on the contact resistance of the ink-jet printed In-Ga-Zn oxide TFTs |
作者 | |
通讯作者 | Dai, H. T. |
DOI | |
发表日期 | 2013
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ISSN | 0277-786X
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EISSN | 1996-756X
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会议录名称 | |
卷号 | 8626
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会议地点 | San Francisco, CA, United states
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出版地 | 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA
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出版者 | |
摘要 | The influence of the metallic electrode materials on the contact resistance of the ink-jet printed In-Ga-Zn oxide (IGZO) thin film transistors (TFTs) is investigated in this paper. Various electrodes, including Al, Ti/Au, ITO and Au were examined based on the inverted staggered (bottom gate top contact) IGZO TFTs. Without additional annealing, the contact resistance increased with the increase of the work function of the electrode, which is Al < Ti/Au < ITO < Au. However, the contact resistance behavior changed drastically for different electrodes under different annealing temperature from 200 to 500 degrees C. The different behavior of the electrodes upon annealing was regarded to the contact modes changed between ohmic and Schottky contact. The finding provides a clue for electrode selection for the ink-jet printed IGZO TFTs to minimize the contact resistance and optimize the device performance according to the process conditions. |
关键词 | |
学校署名 | 其他
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语种 | 英语
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相关链接 | [来源记录] |
收录类别 | |
资助项目 | National Natural Science Foundation of China (NSFC)[61177014]
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WOS研究方向 | Materials Science
; Optics
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WOS类目 | Materials Science, Multidisciplinary
; Optics
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WOS记录号 | WOS:000325342500037
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EI入藏号 | 20132216383547
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EI主题词 | Annealing
; Contact resistance
; Electrodes
; Gallium alloys
; Gallium compounds
; Indium alloys
; Ink
; Ink jet printers
; Semiconducting indium compounds
; Ternary alloys
; Thin film circuits
; Thin films
; Zinc alloys
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EI分类号 | Heat Treatment Processes:537.1
; Zinc and Alloys:546.3
; Nonferrous Metals and Alloys excluding Alkali and Alkaline Earth Metals:549.3
; Electricity: Basic Concepts and Phenomena:701.1
; Compound Semiconducting Materials:712.1.2
; Semiconductor Devices and Integrated Circuits:714.2
; Printing Equipment:745.1.1
; Chemical Products Generally:804
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来源库 | Web of Science
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引用统计 |
被引频次[WOS]:1
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成果类型 | 会议论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/25041 |
专题 | 工学院_电子与电气工程系 |
作者单位 | 1.Tianjin Univ, Sch Sci, Tianjin Key Lab Low Dimens Mat Phys & Preparing T, Tianjin 300072, Peoples R China 2.Singapore Univ Technol & Design, Pillar Engn Prod Dev, Singapore 138682, Singapore 3.South Univ Sci & Technol, Dept Elect & Comp Engn, Shenzhen, Guangdong, Peoples R China |
推荐引用方式 GB/T 7714 |
Han, Y.,Wang, Y.,Dai, H. T.,et al. Influence of the metallic electrodes on the contact resistance of the ink-jet printed In-Ga-Zn oxide TFTs[C]. 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA:SPIE-INT SOC OPTICAL ENGINEERING,2013.
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条目包含的文件 | 条目无相关文件。 |
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