Secure Transmission with Hybrid Relay Scheme: Relaying and Jamming

Xiong, Qi1; Li, Kwok Hung1; Liang, Ying-Chang2; Gong, Yi3

10.1109/EMS.2013.38

2013

2473-3539

UKSIM-AMSS SEVENTH EUROPEAN MODELLING SYMPOSIUM ON COMPUTER MODELLING AND SIMULATION (EMS 2013)

220-224

Manchester, United kingdom

345 E 47TH ST, NEW YORK, NY 10017 USA

IEEE

In this paper, secure transmission is considered in a wireless relay network in the presence of an eavesdropper. A novel hybrid relay scheme, named as relaying-and-jamming (RJ), is advocated to achieve information theoretical security. In the RJ scheme, the relay node is equipped with multiple antennas. It responses for two missions: re-transmitting the information signal from source code and broadcasting the jamming signal to degrade eavesdropper's channel. The objective of this paper is to maximize the achievable ergodic secrecy rate. We are interested in the scenario that eavesdropper's instant channel state information (CSI) is unknown, in which the ergodic secrecy rate expression is derived. The optimal power allocation between information signal and jamming signal at the relay node is found statistically to achieve the largest ergodic secrecy rate. Simulation is carefully designed and respective results are presented to confirm the theoretical analysis and compare with existing work.

ergodic secrecy rate relay-and-jamming (RJ) relay scheme secure transmission

其他

英语

CPCI-S ; EI

Computer Science ; Engineering

Computer Science, Theory & Methods ; Engineering, Electrical & Electronic

WOS:000350449700037

20141917686052

Information theory ; Jamming ; Telecommunication repeaters

Electromagnetic Waves:711 ; Information Theory and Signal Processing:716.1

Web of Science

1.Nanyang Technol Univ, Sch EEE, Singapore 639798, Singapore
2.ASTAR, Inst Infocomm Res, Singapore, Singapore
3.South Univ Sci & Technol China, Dept EE, Shenzhen, Peoples R China

Xiong, Qi,Li, Kwok Hung,Liang, Ying-Chang,et al. Secure Transmission with Hybrid Relay Scheme: Relaying and Jamming[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2013:220-224.