Simultaneous scanning near-field optical and X-ray diffraction microscopy for correlative nanoscale structure-property characterization

Li, Qian1; Marks, Samuel D.1,2; Bean, Sunil1; Fisher, Michael1; Walko, Donald A.1; DiChiara, Anthony D.1; Chen, Xinzhong3; Imura, Keiichiro4; Sato, Noriaki K.4; Liu, Mengkun3,5; Evans, Paul G.2; Wen, Haidan1

2019-09

10.1107/S1600577519008609

JOURNAL OF SYNCHROTRON RADIATION   影响因子和分区

0909-0495

1600-5775

A multimodal imaging instrument has been developed that integrates scanning near-field optical microscopy with nanofocused synchrotron X-ray diffraction imaging. The instrument allows for the simultaneous nanoscale characterization of electronic/near-field optical properties of materials together with their crystallographic structure, facilitating the investigation of local structure-property relationships. The design, implementation and operating procedures of this instrument are reported. The scientific capabilities are demonstrated in a proof-of-principle study of the insulator-metal phase transition in samarium sulfide (SmS) single crystals induced by applying mechanical pressure via a scanning tip. The multimodal imaging of an in situ tip-written region shows that the near-field optical reflectivity can be correlated with the heterogeneously transformed structure of the near-surface region of the crystal.

multimodal imaging X-ray diffraction imaging scanning near-field optical microscopy structure-property correlations insulator-metal transitions samarium sulfide scanning probe microscopy

SCI ; EI

英语

其他

DOE[DE-SC0014664]

Instruments & Instrumentation ; Optics ; Physics

Instruments & Instrumentation ; Optics ; Physics, Applied

WOS:000484666200045

INT UNION CRYSTALLOGRAPHY

20193707438634

Crystal structure ; Metal insulator transition ; Nanotechnology ; Optical data storage ; Optical properties ; Samarium compounds ; Scanning probe microscopy ; Semiconductor insulator boundaries ; Single crystals ; Structural properties ; Sulfur compounds ; X ray diffraction

Structural Design:408 ; Semiconductor Devices and Integrated Circuits:714.2 ; Data Storage, Equipment and Techniques:722.1 ; Light/Optics:741.1 ; Nanotechnology:761 ; Chemistry:801 ; Crystalline Solids:933.1 ; Crystal Lattice:933.1.1 ; Materials Science:951

PHYSICS

Web of Science

1.Argonne Natl Lab, Adv Photon Source, Lemont, IL 60439 USA
2.Univ Wisconsin, Dept Mat Sci & Engn, 1509 Univ Ave, Madison, WI 53706 USA
3.SUNY Stony Brook, Dept Phys, Stony Brook, NY 11794 USA
4.Nagoya Univ, Dept Phys, Nagoya, Aichi 4648602, Japan
5.Southern Univ Sci & Technol, Dept Phys, Shenzhen 518055, Peoples R China

Li, Qian,Marks, Samuel D.,Bean, Sunil,et al. Simultaneous scanning near-field optical and X-ray diffraction microscopy for correlative nanoscale structure-property characterization[J]. JOURNAL OF SYNCHROTRON RADIATION,2019,26:1790-1796.

Li, Qian.,Marks, Samuel D..,Bean, Sunil.,Fisher, Michael.,Walko, Donald A..,...&Wen, Haidan.(2019).Simultaneous scanning near-field optical and X-ray diffraction microscopy for correlative nanoscale structure-property characterization.JOURNAL OF SYNCHROTRON RADIATION,26,1790-1796.

Li, Qian,et al."Simultaneous scanning near-field optical and X-ray diffraction microscopy for correlative nanoscale structure-property characterization".JOURNAL OF SYNCHROTRON RADIATION 26(2019):1790-1796.