题名 | Quantitative Evaluation of Thermal Conductivity of Single-Bent Microwire Using Vanadium Dioxide Temperature Tag |
作者 | |
通讯作者 | Shi, Run; Cheng, Chun |
发表日期 | 2021-10-01
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DOI | |
发表期刊 | |
ISSN | 1862-6300
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EISSN | 1862-6319
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卷号 | 218 |
摘要 | Stress/strain engineering is believed to be an effective way to adjust the thermal conductivity of materials dynamically or as needed. Compared with bulk materials, micro-/nanoscale structures can withstand greater stress/deformations that lead to evident changes in their thermal conductivity after undergoing stress/strain; this phenomenon has been predicted by theoretical simulations. Nevertheless, measuring the effective thermal conductivity of a single wire of a small size upon controllable bending angles has faced major challenges. Herein, a method using VO2 tag as a temperature indicator is developed to achieve the in situ quantitative measurement of the thermal conductivity of bent silicon microwires (MWs), where thermally insulated spider silk is used to adjust the position of the suspended end of wires for different bending angles. It is found that the thermal conductivity of Si wires increases and then decreases upon subsequent bending; it indicates that the thermal conductivity of MWs can be dynamically tuned by bending. Further studies reveal that the variation of thermal conductivity is reversible with small bending (elastic) and irreversible with large bending (plastic). With this setup, new thermophysical properties of materials are explored at small scales, and possible stress/strain-gated thermal switches emerge. |
关键词 | |
相关链接 | [来源记录] |
收录类别 | |
语种 | 英语
|
学校署名 | 第一
; 通讯
|
资助项目 | National Natural Science Foundation of China[91963129,51776094]
; Basic Research Project of Science and Technology Plan of Shenzhen[JCYJ20180504165655180]
; Foundation of Shenzhen Science and Technology Innovation Committee[JCYJ20180302174026262]
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WOS研究方向 | Materials Science
; Physics
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WOS类目 | Materials Science, Multidisciplinary
; Physics, Applied
; Physics, Condensed Matter
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WOS记录号 | WOS:000706576600001
|
出版者 | |
EI入藏号 | 20214211021541
|
EI主题词 | Silicon
; Thermal conductivity
; Thermal Engineering
; Wire
|
EI分类号 | Metal Forming:535.2
; Nonferrous Metals and Alloys excluding Alkali and Alkaline Earth Metals:549.3
; Thermodynamics:641.1
; Inorganic Compounds:804.2
|
ESI学科分类 | PHYSICS
|
来源库 | Web of Science
|
引用统计 |
被引频次[WOS]:1
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成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/254166 |
专题 | 工学院_材料科学与工程系 |
作者单位 | 1.Southern Univ Sci & Technol, Dept Mat Sci & Engn, Shenzhen 518055, Peoples R China 2.Western Sydney Univ, Ctr Infrastructure Engn, Kingswood, NSW 2751, Australia 3.Southern Univ Sci & Technol, Guangdong Prov Key Lab Energy Mat Elect Power, Shenzhen 518055, Peoples R China 4.Southern Univ Sci & Technol, Key Lab Energy Convers & Storage Technol, Minist Educ, Shenzhen 518055, Peoples R China 5.Southern Univ Sci & Technol, Guangdong Hong Kong Macao Joint Lab Photon, Shenzhen 518055, Peoples R China |
第一作者单位 | 材料科学与工程系 |
通讯作者单位 | 材料科学与工程系; 南方科技大学 |
第一作者的第一单位 | 材料科学与工程系 |
推荐引用方式 GB/T 7714 |
Huang, Runqing,Zhao, Yaxuan,Wang, Zixu,et al. Quantitative Evaluation of Thermal Conductivity of Single-Bent Microwire Using Vanadium Dioxide Temperature Tag[J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE,2021,218.
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APA |
Huang, Runqing.,Zhao, Yaxuan.,Wang, Zixu.,Gan, Yichen.,Shen, Nan.,...&Cheng, Chun.(2021).Quantitative Evaluation of Thermal Conductivity of Single-Bent Microwire Using Vanadium Dioxide Temperature Tag.PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE,218.
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MLA |
Huang, Runqing,et al."Quantitative Evaluation of Thermal Conductivity of Single-Bent Microwire Using Vanadium Dioxide Temperature Tag".PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 218(2021).
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条目包含的文件 | 条目无相关文件。 |
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