题名 | Grain-size insensitive work-hardening behavior of Ag microwires |
作者 | |
通讯作者 | Lu, Jian; Lu, Yang |
发表日期 | 2019-06-24
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DOI | |
发表期刊 | |
ISSN | 0921-5093
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EISSN | 1873-4936
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卷号 | 759页码:655-660 |
摘要 | In this study, the work-hardening behavior of Ag microwires with different grain sizes has been investigated, and the results show that the work-hardening rate of Ag microwires does not decrease with the increase of grain size, suggesting that the work-hardening capacity of Ag microwires is insensitive to grain size. Moreover, the microstructure evolution of the samples before and after tensile tests has been characterized using scanning electron microscope-backscattered electron (SEM-BSE), electron backscattered diffraction (EBSD) and transmission electron microscope (TEM). As a typical low stacking faults energy (SFE) material, stacking faults and twins are particularly easy to form in Ag microwires. Abundant stacking faults and twins, as well as minor lattice orientation adjustment in Ag microwires were observed and confirmed to play key roles on their grain-size insensitive work-hardening capacity. The current study provides insights for manufacturing Ag microwires for bonding process and other microelectronics applications. |
关键词 | |
相关链接 | [来源记录] |
收录类别 | |
语种 | 英语
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学校署名 | 其他
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资助项目 | Province-Institute/Province-College Cooperation Project[2017IB016]
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WOS研究方向 | Science & Technology - Other Topics
; Materials Science
; Metallurgy & Metallurgical Engineering
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WOS类目 | Nanoscience & Nanotechnology
; Materials Science, Multidisciplinary
; Metallurgy & Metallurgical Engineering
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WOS记录号 | WOS:000472813900070
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出版者 | |
EI入藏号 | 20192607122347
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EI主题词 | Electrons
; High resolution transmission electron microscopy
; Microelectronics
; Scanning electron microscopy
; Stacking faults
; Strain hardening
; Tensile testing
; Transmission electron microscopy
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EI分类号 | Heat Treatment Processes:537.1
; Optical Devices and Systems:741.3
; Crystal Lattice:933.1.1
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ESI学科分类 | MATERIALS SCIENCE
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来源库 | Web of Science
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引用统计 |
被引频次[WOS]:1
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成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/25659 |
专题 | 工学院_环境科学与工程学院 |
作者单位 | 1.City Univ Hong Kong, Dept Mech Engn, 83 Tat Chee Ave, Hong Kong, Peoples R China 2.City Univ Hong Kong, Hong Kong Branch, Natl Precious Met Mat Engn Res Ctr, 83 Tat Chee Ave, Hong Kong, Peoples R China 3.Southern Univ Sci & Technol, Sch Environm Sci & Engn, 1088 Xueyuan Rd, Shenzhen, Peoples R China 4.City Univ Hong Kong, Shenzhen Res Inst, Ctr Adv Struct Mat, Hong Kong, Peoples R China |
推荐引用方式 GB/T 7714 |
Li, Xiaocui,Yang, Haokun,Meng, Fanling,et al. Grain-size insensitive work-hardening behavior of Ag microwires[J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING,2019,759:655-660.
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APA |
Li, Xiaocui,Yang, Haokun,Meng, Fanling,Lu, Jian,&Lu, Yang.(2019).Grain-size insensitive work-hardening behavior of Ag microwires.MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING,759,655-660.
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MLA |
Li, Xiaocui,et al."Grain-size insensitive work-hardening behavior of Ag microwires".MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING 759(2019):655-660.
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条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | 操作 | |
Li-2019-Grain-size i(2769KB) | -- | -- | 限制开放 | -- |
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