Reliability-Driven Memristive Crossbar Design in Neuromorphic Computing Systems

Xu，Qi1; Wang，Junpeng1; Yuan，Bo2; Sun，Qi3; Chen，Song4; Yu，Bei3; Kang，Yi5; Wu，Feng5

2021

10.1109/TASE.2021.3125065

IEEE Transactions on Automation Science and Engineering   影响因子和分区

1558-3783

Neuromorphic computing system memristive crossbar fault tolerance robustness.

SCI ; EI

其他

20214711211274

Errors ; Fault tolerance

Semiconductor Devices and Integrated Circuits:714.2

IEEE

1.School of Microelectronics, University of Science and Technology of China, Hefei, China.
2.Guangdong Provincial Key Laboratory of Brain-Inspired Intelligent Computation, Department of Computer Science and Engineering, Southern University of Science and Technology, Shenzhen, China.
3.Department of Computer Science and Engineering, The Chinese University of Hong Kong, Hong Kong, SAR.
4.School of Microelectronics, University of Science and Technology of China, Hefei, China, and also with the Institute of Artificial Intelligence, Hefei Comprehensive National Science Center, Hefei, China (e-mail: songch@ustc.edu.cn)
5.School of Microelectronics, University of Science and Technology of China, Hefei, China, and also with the Institute of Artificial Intelligence, Hefei Comprehensive National Science Center, Hefei, China.

Xu，Qi,Wang，Junpeng,Yuan，Bo,et al. Reliability-Driven Memristive Crossbar Design in Neuromorphic Computing Systems[J]. IEEE Transactions on Automation Science and Engineering,2021,PP(99):1-14.

Xu，Qi.,Wang，Junpeng.,Yuan，Bo.,Sun，Qi.,Chen，Song.,...&Wu，Feng.(2021).Reliability-Driven Memristive Crossbar Design in Neuromorphic Computing Systems.IEEE Transactions on Automation Science and Engineering,PP(99),1-14.

Xu，Qi,et al."Reliability-Driven Memristive Crossbar Design in Neuromorphic Computing Systems".IEEE Transactions on Automation Science and Engineering PP.99(2021):1-14.