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题名

Anisotropy dependence of material removal and deformation mechanisms during nanoscratch of gallium nitride single crystals on (0001) plane

作者
通讯作者Li,Chen
发表日期
2022-03-15
DOI
发表期刊
ISSN
0169-4332
EISSN
1873-5584
卷号578
摘要
Gallium nitride single crystal (GaN) is difficult to achieve high-efficiency and low-damage machining due to anisotropy, high hardness and brittleness. Nanoscratch tests of GaN single crystals was conducted on (0001) plane along different zone axes, and the anisotropy dependence of material removal and deformation behaviors were investigated systematically. The results showed that crack-free plastic deformation of GaN crystals could be acquired along different zone axes, which was dominated by phase transition, polycrystalline nanocrystals, amorphous transition, as well as close-to-atomic scale damages including stacking faults, dislocations and lattice distortions. As the stress increases, special surface radial cracks with the same orientations caused by shear stress will appear on the groove surface, and striated and step-shaped brittle fractures can be induced by the propagation and intersection of the cracks. The processing along [11–20] zone axis was more conducive to achieve the plastic removal and deformation, deeper penetration depth and less phase transformation. The higher stress along [1–100] zone axis induced more phase transition from hexagonal system to cubic system. This work will enhance the understanding of the anisotropy dependence of material removal and damage mechanisms, and provide a guide for achieving high-efficiency and low-damage machining of GaN crystals.
关键词
相关链接[Scopus记录]
收录类别
SCI ; EI
语种
英语
学校署名
其他
资助项目
National Natural Science Foundation of China[52005134,51975154] ; China Postdoctoral Science Foundation[2020M670901] ; Heilongjiang Postdoctoral Fund[LBH-Z20016]
WOS研究方向
Chemistry ; Materials Science ; Physics
WOS类目
Chemistry, Physical ; Materials Science, Coatings & Films ; Physics, Applied ; Physics, Condensed Matter
WOS记录号
WOS:000729506400002
出版者
EI入藏号
20214811256209
EI主题词
Cracks ; Efficiency ; Fracture mechanics ; Gallium nitride ; III-V semiconductors ; Nanotechnology ; Shear stress ; Single crystals
EI分类号
Semiconducting Materials:712.1 ; Nanotechnology:761 ; Production Engineering:913.1 ; Mechanics:931.1 ; Physical Properties of Gases, Liquids and Solids:931.2 ; Crystalline Solids:933.1
ESI学科分类
MATERIALS SCIENCE
Scopus记录号
2-s2.0-85120180036
来源库
Scopus
引用统计
被引频次[WOS]:75
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/257842
专题工学院_机械与能源工程系
作者单位
1.School of Mechatronics Engineering,Harbin Institute of Technology,Harbin,150001,China
2.Department of Mechanical and Energy Engineering,Southern University of Science and Technology,Shenzhen,518055,China
推荐引用方式
GB/T 7714
Li,Chen,Piao,Yinchuan,Meng,Binbin,et al. Anisotropy dependence of material removal and deformation mechanisms during nanoscratch of gallium nitride single crystals on (0001) plane[J]. APPLIED SURFACE SCIENCE,2022,578.
APA
Li,Chen,Piao,Yinchuan,Meng,Binbin,Zhang,Yong,Li,Longqiu,&Zhang,Feihu.(2022).Anisotropy dependence of material removal and deformation mechanisms during nanoscratch of gallium nitride single crystals on (0001) plane.APPLIED SURFACE SCIENCE,578.
MLA
Li,Chen,et al."Anisotropy dependence of material removal and deformation mechanisms during nanoscratch of gallium nitride single crystals on (0001) plane".APPLIED SURFACE SCIENCE 578(2022).
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