题名 | Anisotropy dependence of material removal and deformation mechanisms during nanoscratch of gallium nitride single crystals on (0001) plane |
作者 | |
通讯作者 | Li,Chen |
发表日期 | 2022-03-15
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DOI | |
发表期刊 | |
ISSN | 0169-4332
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EISSN | 1873-5584
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卷号 | 578 |
摘要 | Gallium nitride single crystal (GaN) is difficult to achieve high-efficiency and low-damage machining due to anisotropy, high hardness and brittleness. Nanoscratch tests of GaN single crystals was conducted on (0001) plane along different zone axes, and the anisotropy dependence of material removal and deformation behaviors were investigated systematically. The results showed that crack-free plastic deformation of GaN crystals could be acquired along different zone axes, which was dominated by phase transition, polycrystalline nanocrystals, amorphous transition, as well as close-to-atomic scale damages including stacking faults, dislocations and lattice distortions. As the stress increases, special surface radial cracks with the same orientations caused by shear stress will appear on the groove surface, and striated and step-shaped brittle fractures can be induced by the propagation and intersection of the cracks. The processing along [11–20] zone axis was more conducive to achieve the plastic removal and deformation, deeper penetration depth and less phase transformation. The higher stress along [1–100] zone axis induced more phase transition from hexagonal system to cubic system. This work will enhance the understanding of the anisotropy dependence of material removal and damage mechanisms, and provide a guide for achieving high-efficiency and low-damage machining of GaN crystals. |
关键词 | |
相关链接 | [Scopus记录] |
收录类别 | |
语种 | 英语
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学校署名 | 其他
|
资助项目 | National Natural Science Foundation of China[52005134,51975154]
; China Postdoctoral Science Foundation[2020M670901]
; Heilongjiang Postdoctoral Fund[LBH-Z20016]
|
WOS研究方向 | Chemistry
; Materials Science
; Physics
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WOS类目 | Chemistry, Physical
; Materials Science, Coatings & Films
; Physics, Applied
; Physics, Condensed Matter
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WOS记录号 | WOS:000729506400002
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出版者 | |
EI入藏号 | 20214811256209
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EI主题词 | Cracks
; Efficiency
; Fracture mechanics
; Gallium nitride
; III-V semiconductors
; Nanotechnology
; Shear stress
; Single crystals
|
EI分类号 | Semiconducting Materials:712.1
; Nanotechnology:761
; Production Engineering:913.1
; Mechanics:931.1
; Physical Properties of Gases, Liquids and Solids:931.2
; Crystalline Solids:933.1
|
ESI学科分类 | MATERIALS SCIENCE
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Scopus记录号 | 2-s2.0-85120180036
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来源库 | Scopus
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引用统计 |
被引频次[WOS]:75
|
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/257842 |
专题 | 工学院_机械与能源工程系 |
作者单位 | 1.School of Mechatronics Engineering,Harbin Institute of Technology,Harbin,150001,China 2.Department of Mechanical and Energy Engineering,Southern University of Science and Technology,Shenzhen,518055,China |
推荐引用方式 GB/T 7714 |
Li,Chen,Piao,Yinchuan,Meng,Binbin,et al. Anisotropy dependence of material removal and deformation mechanisms during nanoscratch of gallium nitride single crystals on (0001) plane[J]. APPLIED SURFACE SCIENCE,2022,578.
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APA |
Li,Chen,Piao,Yinchuan,Meng,Binbin,Zhang,Yong,Li,Longqiu,&Zhang,Feihu.(2022).Anisotropy dependence of material removal and deformation mechanisms during nanoscratch of gallium nitride single crystals on (0001) plane.APPLIED SURFACE SCIENCE,578.
|
MLA |
Li,Chen,et al."Anisotropy dependence of material removal and deformation mechanisms during nanoscratch of gallium nitride single crystals on (0001) plane".APPLIED SURFACE SCIENCE 578(2022).
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条目包含的文件 | 条目无相关文件。 |
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