题名 | Defect Engineering in Single-Layer MoS2 Using Heavy Ion Irradiation |
作者 | |
通讯作者 | Wang, Xinwei; Chen, Yan |
发表日期 | 2018-12-12
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DOI | |
发表期刊 | |
ISSN | 1944-8244
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EISSN | 1944-8252
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卷号 | 10期号:49页码:42524-42533 |
摘要 | Transition metal dichalcogenides (TMDs) have attracted much attention due to their promising optical, electronic, magnetic, and catalytic properties. Engineering the defects in TMDs represents an effective way to achieve novel functionalities and superior performance of TMDs devices. However, it remains a significant challenge to create defects in TMDs in a controllable manner or to correlate the nature of defects with their functionalities. In this work, taking single-layer MoS2 as a model system, defects with controlled densities are generated by 500 keV Au irradiation with different ion fluences, and the generated defects are mostly S vacancies. We further show that the defects introduced by ion irradiation can significantly affect the properties of the single-layer MoS2, leading to considerable changes in its photoluminescence characteristics and electrocatalytic behavior. As the defect density increases, the characteristic photoluminescence peak of MoS2 first blueshifts and then redshifts, which is likely due to the electron transfer from MoS2 to the adsorbed O-2 at the defect sites. The generation of the defects can also strongly improve the hydrogen evolution reaction activity of MoS2, attributed to the modified adsorption of atomic hydrogen at the defects. |
关键词 | |
相关链接 | [来源记录] |
收录类别 | |
语种 | 英语
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学校署名 | 其他
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资助项目 | Guangzhou Science and Technology Program General Projects[201707010146]
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WOS研究方向 | Science & Technology - Other Topics
; Materials Science
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WOS类目 | Nanoscience & Nanotechnology
; Materials Science, Multidisciplinary
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WOS记录号 | WOS:000453488900074
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出版者 | |
EI入藏号 | 20185006237407
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EI主题词 | Defects
; Heavy ions
; Hydrogen
; Ion beams
; Ion bombardment
; Layered semiconductors
; Molybdenum compounds
; Photoluminescence
; Transition metals
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EI分类号 | Metallurgy and Metallography:531
; Light/Optics:741.1
; Chemical Products Generally:804
; High Energy Physics:932.1
; Materials Science:951
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来源库 | Web of Science
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引用统计 |
被引频次[WOS]:149
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成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/26802 |
专题 | 理学院_物理系 量子科学与工程研究院 |
作者单位 | 1.South China Univ Technol, Guangzhou Key Lab Surface Chem Energy Mat, New Energy Res Inst, Sch Environm & Energy, Guangzhou 510006, Guangdong, Peoples R China 2.Peking Univ, Shenzhen Grad Sch, Sch Adv Mat, Shenzhen 518055, Peoples R China 3.China Inst Nucl Informat & Econ, Beijing 100871, Peoples R China 4.Southern Univ Sci & Technol, Dept Phys, Shenzhen 518055, Peoples R China 5.Southern Univ Sci & Technol, Shenzhen Inst Quantum Sci & Engn, Shenzhen 518055, Peoples R China 6.Penn State Univ, Dept Elect Engn, University Pk, PA 16802 USA 7.Peking Univ, Sch Phys, State Key Lab Nucl Phys & Technol, Beijing 100871, Peoples R China 8.Georgia Inst Technol, Mat Sci & Engn, Atlanta, GA 30332 USA |
推荐引用方式 GB/T 7714 |
He, Zuyun,Zhao, Ran,Chen, Xiaofei,et al. Defect Engineering in Single-Layer MoS2 Using Heavy Ion Irradiation[J]. ACS Applied Materials & Interfaces,2018,10(49):42524-42533.
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APA |
He, Zuyun.,Zhao, Ran.,Chen, Xiaofei.,Chen, Huijun.,Zhu, Yunmin.,...&Chen, Yan.(2018).Defect Engineering in Single-Layer MoS2 Using Heavy Ion Irradiation.ACS Applied Materials & Interfaces,10(49),42524-42533.
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MLA |
He, Zuyun,et al."Defect Engineering in Single-Layer MoS2 Using Heavy Ion Irradiation".ACS Applied Materials & Interfaces 10.49(2018):42524-42533.
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条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | 操作 | |
He-2018-Defect Engin(3802KB) | -- | -- | 限制开放 | -- |
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