In-Plane Optical Anisotropy and Linear Dichroism in Low-Symmetry Layered TlSe

Yang, Shengxue1; Hu, Chunguang2; Wu, Minghui3; Shen, Wanfu2; Tongay, Sefaattin4; Wu, Kedi4; Wei, Bin5; Sun, Zhaoyang2; Jiang, Chengbao1; Huang, Li3; Wang, Zhongchang5

2018-08

10.1021/acsnano.8b05162

ACS Nano   影响因子和分区

1936-0851

1936-086X

In-plane anisotropy of layered materials adds another dimension to their applications, opening up avenues in diverse angle-resolved devices. However, to fulfill a strong inherent in-plane anisotropy in layered materials still poses a significant challenge, as it often requires a low-symmetry nature of layered materials. Here, we report the fabrication of a member of layered semiconducting A(III)B(VI) compounds, TlSe, that possesses a low-symmetry tetragonal structure and investigate its anisotropic light matter interactions. We first identify the in-plane Raman intensity anisotropy of thin-layer TlSe, offering unambiguous evidence that the anisotropy is sensitive to crystalline orientation. Further in-situ azimuth-dependent reflectance difference microscopy enables the direct evaluation of in-plane optical anisotropy of layered TlSe, and we demonstrate that the TlSe shows a linear dichroism under polarized absorption spectra arising from an in-plane anisotropic optical property. As a direct result of the linear dichroism, we successfully fabricate TlSe devices for polarization-sensitive photodetection. The discovery of layered TlSe with a strong in-plane anisotropy not only facilitates its applications in linear dichroic photodetection but opens up more possibilities for other functional device applications.

anisotropy linear dichroism low-symmetry layered material TlSe polarization-sensitive photodetector

SCI ; EI

英语

NI期刊

通讯

Shenzhen Peacock Plan Team[KQTD2016022619565991]

Chemistry ; Science & Technology - Other Topics ; Materials Science

Chemistry, Multidisciplinary ; Chemistry, Physical ; Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary

WOS:000443525600134

AMER CHEMICAL SOC

20183505755212

Dichroism ; Layered semiconductors ; Optical anisotropy ; Photodetectors ; Selenium compounds

Light/Optics:741.1 ; Physical Properties of Gases, Liquids and Solids:931.2

Web of Science

1.Beihang Univ, Sch Mat Sci & Engn, Beijing 100191, Peoples R China
2.Tianjin Univ, State Key Lab Precis Measuring Technol & Instrume, Weijin Rd, CN-300072 Tianjin, Peoples R China
3.Southern Univ Sci & Technol, Dept Phys, Shenzhen 518005, Peoples R China
4.Arizona State Univ, Sch Engn Matter Transport & Energy, Tempe, AZ 85287 USA
5.Int Iberian Nanotechnol Lab INL, Dept Quantum & Energy Mat, Ave Mestre Jose Veiga S-N, P-4715330 Braga, Portugal

Yang, Shengxue,Hu, Chunguang,Wu, Minghui,et al. In-Plane Optical Anisotropy and Linear Dichroism in Low-Symmetry Layered TlSe[J]. ACS Nano,2018,12(8):8798-8807.

Yang, Shengxue.,Hu, Chunguang.,Wu, Minghui.,Shen, Wanfu.,Tongay, Sefaattin.,...&Wang, Zhongchang.(2018).In-Plane Optical Anisotropy and Linear Dichroism in Low-Symmetry Layered TlSe.ACS Nano,12(8),8798-8807.

Yang, Shengxue,et al."In-Plane Optical Anisotropy and Linear Dichroism in Low-Symmetry Layered TlSe".ACS Nano 12.8(2018):8798-8807.