中文版 | English
题名

Gate-tunable strong-weak localization transition in few-layer black phosphorus

作者
通讯作者Wang, Xinran
发表日期
2018-01-19
DOI
发表期刊
ISSN
0957-4484
EISSN
1361-6528
卷号29期号:3
摘要
Atomically-thin black phosphorus (BP) field-effect transistors show strong-weak localization transition, which is tunable through gate voltages. Hopping transports through charge impurityinduced localized states are observed at low carrier density regime. Variable-range hopping model is applied to simulate scattering behaviors of charge carriers. In the high carrier concentration regime, a negative magnetoresistance indicates weak localization effects. The extracted phase coherence length is power-law temperature-dependent (similar to T-0.48 +/- 0.03) and demonstrates inelastic electron-electron interactions and the 2D transport features in few-layer BP field-effect devices. The competition between localization and phase coherence lengths is investigated and analyzed based on observed gate-tunable strong-weak localization transition in few-layer BP.
关键词
相关链接[来源记录]
收录类别
SCI ; EI
语种
英语
学校署名
其他
资助项目
Guangdong-Hong Kong joint innovation project[2016A050503012]
WOS研究方向
Science & Technology - Other Topics ; Materials Science ; Physics
WOS类目
Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied
WOS记录号
WOS:000418355300003
出版者
EI入藏号
20175204572033
EI主题词
Carrier concentration ; Electron-electron interactions ; Phosphorus
EI分类号
Electricity: Basic Concepts and Phenomena:701.1 ; Semiconductor Devices and Integrated Circuits:714.2 ; Chemical Products Generally:804 ; Atomic and Molecular Physics:931.3
ESI学科分类
MATERIALS SCIENCE
来源库
Web of Science
引用统计
被引频次[WOS]:9
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/28142
专题工学院_材料科学与工程系
作者单位
1.Hong Kong Univ Sci & Technol, Dept Phys, Hong Kong, Peoples R China
2.Hong Kong Univ Sci & Technol, Ctr Quantum Mat, Hong Kong, Peoples R China
3.South Univ Sci & Technol, Dept Mat Sci & Engn, Shenzhen 518055, Peoples R China
4.South Univ Sci & Technol, Shenzhen Key Lab Nanoimprint Technol, Shenzhen 518055, Peoples R China
5.Nanjing Univ, Sch Elect Sci & Engn, Natl Lab Solid State Microstruct, Nanjing 210093, Jiangsu, Peoples R China
6.Nanjing Univ, Collaborat Innovat Ctr Adv Microstruct, Nanjing 210093, Jiangsu, Peoples R China
推荐引用方式
GB/T 7714
Long, Gen,Xu, Shuigang,Cai, Xiangbin,et al. Gate-tunable strong-weak localization transition in few-layer black phosphorus[J]. NANOTECHNOLOGY,2018,29(3).
APA
Long, Gen.,Xu, Shuigang.,Cai, Xiangbin.,Wu, Zefei.,Han, Tianyi.,...&Wang, Ning.(2018).Gate-tunable strong-weak localization transition in few-layer black phosphorus.NANOTECHNOLOGY,29(3).
MLA
Long, Gen,et al."Gate-tunable strong-weak localization transition in few-layer black phosphorus".NANOTECHNOLOGY 29.3(2018).
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