题名 | Gate-tunable strong-weak localization transition in few-layer black phosphorus |
作者 | |
通讯作者 | Wang, Xinran |
发表日期 | 2018-01-19
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DOI | |
发表期刊 | |
ISSN | 0957-4484
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EISSN | 1361-6528
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卷号 | 29期号:3 |
摘要 | Atomically-thin black phosphorus (BP) field-effect transistors show strong-weak localization transition, which is tunable through gate voltages. Hopping transports through charge impurityinduced localized states are observed at low carrier density regime. Variable-range hopping model is applied to simulate scattering behaviors of charge carriers. In the high carrier concentration regime, a negative magnetoresistance indicates weak localization effects. The extracted phase coherence length is power-law temperature-dependent (similar to T-0.48 +/- 0.03) and demonstrates inelastic electron-electron interactions and the 2D transport features in few-layer BP field-effect devices. The competition between localization and phase coherence lengths is investigated and analyzed based on observed gate-tunable strong-weak localization transition in few-layer BP. |
关键词 | |
相关链接 | [来源记录] |
收录类别 | |
语种 | 英语
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学校署名 | 其他
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资助项目 | Guangdong-Hong Kong joint innovation project[2016A050503012]
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WOS研究方向 | Science & Technology - Other Topics
; Materials Science
; Physics
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WOS类目 | Nanoscience & Nanotechnology
; Materials Science, Multidisciplinary
; Physics, Applied
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WOS记录号 | WOS:000418355300003
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出版者 | |
EI入藏号 | 20175204572033
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EI主题词 | Carrier concentration
; Electron-electron interactions
; Phosphorus
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EI分类号 | Electricity: Basic Concepts and Phenomena:701.1
; Semiconductor Devices and Integrated Circuits:714.2
; Chemical Products Generally:804
; Atomic and Molecular Physics:931.3
|
ESI学科分类 | MATERIALS SCIENCE
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来源库 | Web of Science
|
引用统计 |
被引频次[WOS]:9
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成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/28142 |
专题 | 工学院_材料科学与工程系 |
作者单位 | 1.Hong Kong Univ Sci & Technol, Dept Phys, Hong Kong, Peoples R China 2.Hong Kong Univ Sci & Technol, Ctr Quantum Mat, Hong Kong, Peoples R China 3.South Univ Sci & Technol, Dept Mat Sci & Engn, Shenzhen 518055, Peoples R China 4.South Univ Sci & Technol, Shenzhen Key Lab Nanoimprint Technol, Shenzhen 518055, Peoples R China 5.Nanjing Univ, Sch Elect Sci & Engn, Natl Lab Solid State Microstruct, Nanjing 210093, Jiangsu, Peoples R China 6.Nanjing Univ, Collaborat Innovat Ctr Adv Microstruct, Nanjing 210093, Jiangsu, Peoples R China |
推荐引用方式 GB/T 7714 |
Long, Gen,Xu, Shuigang,Cai, Xiangbin,et al. Gate-tunable strong-weak localization transition in few-layer black phosphorus[J]. NANOTECHNOLOGY,2018,29(3).
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APA |
Long, Gen.,Xu, Shuigang.,Cai, Xiangbin.,Wu, Zefei.,Han, Tianyi.,...&Wang, Ning.(2018).Gate-tunable strong-weak localization transition in few-layer black phosphorus.NANOTECHNOLOGY,29(3).
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MLA |
Long, Gen,et al."Gate-tunable strong-weak localization transition in few-layer black phosphorus".NANOTECHNOLOGY 29.3(2018).
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条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | 操作 | |
Long-2018-Gate-tunab(1491KB) | -- | -- | 限制开放 | -- |
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