题名 | Double nanoimprint lithography: A technology for effectively reducing feature size |
作者 | |
通讯作者 | Cui, Dehu |
发表日期 | 2017-11
|
DOI | |
发表期刊 | |
ISSN | 1071-1023
|
卷号 | 35期号:6 |
摘要 | Recently, the authors observed ubiquitous polymer chain ordering in polymer micro- and nanostructures patterned by thermal nanoimprint. These polymer materials exhibit chain ordering during melt processing, which indicates that the double nanoimprint technique has been successfully performed. In this work, the authors present the double nanoimprint technique at elevated temperature for reducing the patterning size of thermoplastic functional polymers without the need for excessive imprint pressure, which eventually results in the size decrease in pattern formation. This double nanoimprint technique is a further application of thermal nanoimprint, followed by anisotropy of material properties, such as the refractive index and optical absorption. (C) 2017 American Vacuum Society. |
相关链接 | [来源记录] |
收录类别 | |
语种 | 英语
|
学校署名 | 第一
; 通讯
|
资助项目 | [JCYJ20160331115147389]
|
WOS研究方向 | Engineering
; Science & Technology - Other Topics
; Physics
|
WOS类目 | Engineering, Electrical & Electronic
; Nanoscience & Nanotechnology
; Physics, Applied
|
WOS记录号 | WOS:000416602700005
|
出版者 | |
EI入藏号 | 20174304294489
|
EI主题词 | Light Absorption
; Refractive Index
|
EI分类号 | Light/optics:741.1
; Nanotechnology:761
; Solid State Physics:933
|
ESI学科分类 | MATERIALS SCIENCE
|
来源库 | Web of Science
|
引用统计 |
被引频次[WOS]:1
|
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/28459 |
专题 | 工学院_电子与电气工程系 |
作者单位 | Southern Univ Sci & Technol, Dept Elect & Elect Engn, Shenzhen 518055, Peoples R China |
第一作者单位 | 电子与电气工程系 |
通讯作者单位 | 电子与电气工程系 |
第一作者的第一单位 | 电子与电气工程系 |
推荐引用方式 GB/T 7714 |
Ma, Xiaohao,Deng, Dandan,Cui, Dehu. Double nanoimprint lithography: A technology for effectively reducing feature size[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,2017,35(6).
|
APA |
Ma, Xiaohao,Deng, Dandan,&Cui, Dehu.(2017).Double nanoimprint lithography: A technology for effectively reducing feature size.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,35(6).
|
MLA |
Ma, Xiaohao,et al."Double nanoimprint lithography: A technology for effectively reducing feature size".JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 35.6(2017).
|
条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | 操作 | |
1.4991631.pdf(877KB) | -- | -- | 限制开放 | -- |
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