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题名

Brief Review of Epitaxy and Emission Properties of GaSb and Related Semiconductors

作者
通讯作者Wei, Zhipeng
发表日期
2017-11
DOI
发表期刊
ISSN
2073-4352
卷号7期号:11
摘要

Groups III-V semiconductors have received a great deal of attention because of their potential advantages for use in optoelectronic and electronic applications. Gallium antimonide (GaSb) and GaSb-related semiconductors, which exhibit high carrier mobility and a narrow band gap (0.725 eV at 300 K), have been recognized as suitable candidates for high-performance optoelectronics in the mid-infrared range. However, the performances of the resulting devices are strongly dependent on the structural and emission properties of the materials. Enhancement of the crystal quality, adjustment of the alloy components, and improvement of the emission properties have therefore become the focus of research efforts toward GaSb semiconductors. Molecular beam epitaxy (MBE) is suitable for the large-scale production of GaSb, especially for high crystal quality and beneficial optical properties. We review the recent progress in the epitaxy of GaSb materials, including films and nanostructures composed of GaSb-related alloys and compounds. The emission properties of these materials and their relationships to the alloy components and material structures are also discussed. Specific examples are included to provide insight on the common general physical and optical properties and parameters involved in the synergistic epitaxy processes. In addition, the further directions for the epitaxy of GaSb materials are forecasted.

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相关链接[来源记录]
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语种
英语
学校署名
其他
资助项目
national 1000 plan for young talents and Shenzhen Science and Technology Innovation Committee[JCYJ20150630162649956] ; national 1000 plan for young talents and Shenzhen Science and Technology Innovation Committee[JCYJ20150930160634263] ; national 1000 plan for young talents and Shenzhen Science and Technology Innovation Committee[KQTD2015071710313656]
WOS研究方向
Crystallography ; Materials Science
WOS类目
Crystallography ; Materials Science, Multidisciplinary
WOS记录号
WOS:000416601500016
出版者
来源库
Web of Science
引用统计
被引频次[WOS]:8
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/28480
专题工学院_电子与电气工程系
作者单位
1.Changchun Univ Sci & Technol, Sch Sci, State Key Lab High Power Semicond Lasers, 7089 Wei Xing Rd, Changchun 130022, Jilin, Peoples R China
2.South Univ Sci & Technol China, Dept Elect & Elect Engn, Shenzhen 518055, Peoples R China
推荐引用方式
GB/T 7714
Niu, Shouzhu,Wei, Zhipeng,Fang, Xuan,et al. Brief Review of Epitaxy and Emission Properties of GaSb and Related Semiconductors[J]. Crystals,2017,7(11).
APA
Niu, Shouzhu.,Wei, Zhipeng.,Fang, Xuan.,Wang, Dengkui.,Wang, Xinwei.,...&Chen, Rui.(2017).Brief Review of Epitaxy and Emission Properties of GaSb and Related Semiconductors.Crystals,7(11).
MLA
Niu, Shouzhu,et al."Brief Review of Epitaxy and Emission Properties of GaSb and Related Semiconductors".Crystals 7.11(2017).
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