题名 | Brief Review of Epitaxy and Emission Properties of GaSb and Related Semiconductors |
作者 | |
通讯作者 | Wei, Zhipeng |
发表日期 | 2017-11
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DOI | |
发表期刊 | |
ISSN | 2073-4352
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卷号 | 7期号:11 |
摘要 | Groups III-V semiconductors have received a great deal of attention because of their potential advantages for use in optoelectronic and electronic applications. Gallium antimonide (GaSb) and GaSb-related semiconductors, which exhibit high carrier mobility and a narrow band gap (0.725 eV at 300 K), have been recognized as suitable candidates for high-performance optoelectronics in the mid-infrared range. However, the performances of the resulting devices are strongly dependent on the structural and emission properties of the materials. Enhancement of the crystal quality, adjustment of the alloy components, and improvement of the emission properties have therefore become the focus of research efforts toward GaSb semiconductors. Molecular beam epitaxy (MBE) is suitable for the large-scale production of GaSb, especially for high crystal quality and beneficial optical properties. We review the recent progress in the epitaxy of GaSb materials, including films and nanostructures composed of GaSb-related alloys and compounds. The emission properties of these materials and their relationships to the alloy components and material structures are also discussed. Specific examples are included to provide insight on the common general physical and optical properties and parameters involved in the synergistic epitaxy processes. In addition, the further directions for the epitaxy of GaSb materials are forecasted. |
关键词 | |
相关链接 | [来源记录] |
收录类别 | |
语种 | 英语
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学校署名 | 其他
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资助项目 | national 1000 plan for young talents and Shenzhen Science and Technology Innovation Committee[JCYJ20150630162649956]
; national 1000 plan for young talents and Shenzhen Science and Technology Innovation Committee[JCYJ20150930160634263]
; national 1000 plan for young talents and Shenzhen Science and Technology Innovation Committee[KQTD2015071710313656]
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WOS研究方向 | Crystallography
; Materials Science
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WOS类目 | Crystallography
; Materials Science, Multidisciplinary
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WOS记录号 | WOS:000416601500016
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出版者 | |
来源库 | Web of Science
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引用统计 |
被引频次[WOS]:8
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成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/28480 |
专题 | 工学院_电子与电气工程系 |
作者单位 | 1.Changchun Univ Sci & Technol, Sch Sci, State Key Lab High Power Semicond Lasers, 7089 Wei Xing Rd, Changchun 130022, Jilin, Peoples R China 2.South Univ Sci & Technol China, Dept Elect & Elect Engn, Shenzhen 518055, Peoples R China |
推荐引用方式 GB/T 7714 |
Niu, Shouzhu,Wei, Zhipeng,Fang, Xuan,et al. Brief Review of Epitaxy and Emission Properties of GaSb and Related Semiconductors[J]. Crystals,2017,7(11).
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APA |
Niu, Shouzhu.,Wei, Zhipeng.,Fang, Xuan.,Wang, Dengkui.,Wang, Xinwei.,...&Chen, Rui.(2017).Brief Review of Epitaxy and Emission Properties of GaSb and Related Semiconductors.Crystals,7(11).
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MLA |
Niu, Shouzhu,et al."Brief Review of Epitaxy and Emission Properties of GaSb and Related Semiconductors".Crystals 7.11(2017).
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条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | 操作 | |
crystals-07-00337.pd(8181KB) | -- | -- | 开放获取 | -- | 浏览 |
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