Rapid and nondestructive layer number identification of two-dimensional layered transition metal dichalcogenides

Wu, Jia-Peng1,2; Wang, Le1,2; Zhang, Li-Yuan3

2017-09

10.1007/s12598-017-0927-4

RARE METALS   影响因子和分区

1001-0521

1867-7185

MoS2, MoSe2 and WSe2 thin flakes were fabricated by the standard micromechanical cleavage procedures. The thickness and the optical contrast of the atomic thin dichalcogenide flakes on SiO2/Si substrates were measured by atomic force microscopy (AFM) and spectroscopic ellipsometer. A rapid and nondestructive method by using reflection spectra was proposed to identify the layer number of 2D layered transition metal dichalcogenides on SiO2 (275 nm)/Si substrates. The contrast spectra of 2D nanosheets with different layer numbers are in agreement with theoretical calculations based on Fresnel's law, indicating that this method provides an unambiguous and nondestructive contrast spectra fingerprint for identifying single- and few-layered transition metal dichalcogenides. The results will greatly help in fundamental research and application.

Transition metal dichalcogenides Optical contrast Layer number identification

SCI ; EI

英语

其他

National Natural Science Foundation of China[11304381] ; National Natural Science Foundation of China[11174366]

Materials Science ; Metallurgy & Metallurgical Engineering

Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering

WOS:000408579500002

NONFERROUS METALS SOC CHINA

20172603843950

Atomic force microscopy ; Layered semiconductors ; Molybdenum compounds ; Selenium compounds ; Silica ; Transition metals ; Tungsten compounds

Metallurgy and Metallography:531 ; Optical Devices and Systems:741.3

MATERIALS SCIENCE

Web of Science

1.Renmin Univ China, Dept Phys, Beijing 100872, Peoples R China
2.Renmin Univ China, Beijing Key Lab Optoelect Funct Mat & Micro Nano, Beijing 100872, Peoples R China
3.South Univ Sci & Technol China, Dept Phys, Shenzhen 518055, Peoples R China

Wu, Jia-Peng,Wang, Le,Zhang, Li-Yuan. Rapid and nondestructive layer number identification of two-dimensional layered transition metal dichalcogenides[J]. RARE METALS,2017,36(9):698-703.

Wu, Jia-Peng,Wang, Le,&Zhang, Li-Yuan.(2017).Rapid and nondestructive layer number identification of two-dimensional layered transition metal dichalcogenides.RARE METALS,36(9),698-703.

Wu, Jia-Peng,et al."Rapid and nondestructive layer number identification of two-dimensional layered transition metal dichalcogenides".RARE METALS 36.9(2017):698-703.