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题名

Sub-10 nm Nanopattern Architecture for 2D Material Field-Effect Transistors

作者
通讯作者Xiong, Jie; Liu, Qian; He, Jun
发表日期
2017-02
DOI
发表期刊
ISSN
1530-6984
EISSN
1530-6992
卷号17期号:2页码:1065-1070
摘要
Two-dimensional materials (2DMs) are competitive candidates in replacing or supplementing conventional semiconductors owing to their atomically uniform thickness.-However, current conventional micro/nanofabrication technologies realize hardly ultrashort channel and integration, especially for sub-10 nm. Meanwhile, experimental device performance associated with the scaling of dimension needs to be investigated, due to the short channel effects. Here, we show a novel and universal technological method to fabricate sub-10 rim gaps with sharp edges and steep sidewalls. The realization of sub-10 nm gaps derives from a corrosion crack along the cleavage plane of Bi2O3. By this method, ultrathin body field-effect transistors (FETs), consisting of 8.2 nm channel length, 6 rim high-k dielectric, and 0.7 nm monolayer MoS2, exhibit no obvious short channel effects. The corresponding current on/off ratio and subthreshold swing reaches to 106 and 140 mV/dec, respectively. Moreover, integrated circuits with sub-10 nm channel are capable of operating as digital inverters with high voltage gain. The results suggest our technological method can be used to fabricate the ultrashort channel nanopatterns, build the experimental groundwork for 2DMs FETs with sub-10 rim channel length and 2DMs integrated circuits, and offer new potential opportunities for large-scale device constructions and applications.
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相关链接[来源记录]
收录类别
SCI ; EI
语种
英语
重要成果
NI期刊
学校署名
其他
资助项目
Strategic Priority Research Program of the Chinese Academy of Sciences[XDA 09040201] ; Strategic Priority Research Program of the Chinese Academy of Sciences[XDA 09020300]
WOS研究方向
Chemistry ; Science & Technology - Other Topics ; Materials Science ; Physics
WOS类目
Chemistry, Multidisciplinary ; Chemistry, Physical ; Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied ; Physics, Condensed Matter
WOS记录号
WOS:000393848800065
出版者
EI入藏号
20170703341077
EI主题词
Bismuth compounds ; High-k dielectric ; Layered semiconductors ; Molybdenum compounds ; Threshold voltage ; VLSI circuits
EI分类号
Electricity: Basic Concepts and Phenomena:701.1 ; Semiconductor Devices and Integrated Circuits:714.2
ESI学科分类
MATERIALS SCIENCE
来源库
Web of Science
引用统计
被引频次[WOS]:175
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/29157
专题理学院_物理系
作者单位
1.Chinese Acad Sci, Key Lab Nanosyst & Hierarchy Fabricat, CAS Ctr Excellence Nanosci, Natl Ctr Nanosci & Technol, Beijing 100190, Peoples R China
2.Nankai Univ, MOE Key Lab Weak Light Nonlinear Photon, Tianjin 300457, Peoples R China
3.Nankai Univ, TEDA Appl Phys Inst, Tianjin 300457, Peoples R China
4.Nankai Univ, Sch Phys, Tianjin 300457, Peoples R China
5.Univ Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Peoples R China
6.Univ Chinese Acad Sci, Beijing 100080, Peoples R China
7.Peking Univ, Sch Phys, State Key Lab Mesoscop Phys, Beijing 100871, Peoples R China
8.South Univ Sci & Technol China, Dept Phys, Shenzhen 518005, Peoples R China
推荐引用方式
GB/T 7714
Xu, Kai,Chen, Dongxue,Yang, Fengyou,et al. Sub-10 nm Nanopattern Architecture for 2D Material Field-Effect Transistors[J]. NANO LETTERS,2017,17(2):1065-1070.
APA
Xu, Kai.,Chen, Dongxue.,Yang, Fengyou.,Wang, Zhenxin.,Yin, Lei.,...&He, Jun.(2017).Sub-10 nm Nanopattern Architecture for 2D Material Field-Effect Transistors.NANO LETTERS,17(2),1065-1070.
MLA
Xu, Kai,et al."Sub-10 nm Nanopattern Architecture for 2D Material Field-Effect Transistors".NANO LETTERS 17.2(2017):1065-1070.
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