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题名

Tomography of a Probe Potential Using Atomic Sensors on Graphene

作者
通讯作者Stroscio, Joseph A.
发表日期
2016-12
DOI
发表期刊
ISSN
1936-0851
EISSN
1936-086X
卷号10期号:12页码:10698-10705
摘要

Our ability to access and explore the quantum world has been greatly advanced by the power of atomic manipulation and local spectroscopy with scanning tunneling and atomic force microscopes, where the key technique is the use of atomically sharp probe tips to interact with an underlying substrate. Here we employ atomic manipulation to modify and quantify the interaction between the probe and the system under study that can strongly affect any measurement in low charge density systems, such as graphene. We transfer Co atoms from a graphene surface onto a probe tip to change and control the probe's physical structure, enabling us to modify the induced potential at a graphene surface. We utilize single Co atoms on a graphene field-effect device as atomic scale sensors to quantitatively map the modified potential exerted by the scanning probe over the whole relevant spatial and energy range.

关键词
相关链接[来源记录]
收录类别
SCI ; EI
语种
英语
重要成果
NI期刊
学校署名
其他
资助项目
National Institute of Standards and Technology Center for Nanoscale Science and Technology[70NANB10H193]
WOS研究方向
Chemistry ; Science & Technology - Other Topics ; Materials Science
WOS类目
Chemistry, Multidisciplinary ; Chemistry, Physical ; Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary
WOS记录号
WOS:000391079700012
出版者
EI入藏号
20170103222822
EI主题词
Atomic Force Microscopy ; Cobalt ; Screening
EI分类号
Nonferrous Metals And Alloys Excluding Alkali And Alkaline Earth Metals:549.3 ; Optical Devices And Systems:741.3 ; Nanotechnology:761 ; Chemical Operations:802.3 ; Chemical Products Generally:804
来源库
Web of Science
引用统计
被引频次[WOS]:12
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/29354
专题理学院_物理系
作者单位
1.NIST, Ctr Nanoscale Sci & Technol, Gaithersburg, MD 20899 USA
2.Univ Maryland, Maryland NanoCtr, College Pk, MD 20742 USA
3.South Univ Sci & Technol China, Dept Phys, Shenzhen 518055, Peoples R China
4.Natl Inst Mat Sci, Adv Mat Lab, Tsukuba, Ibaraki 3050044, Japan
第一作者单位物理系
推荐引用方式
GB/T 7714
Zhao, Yue,Wyrick, Jonathan,Natterer, Fabian D.,et al. Tomography of a Probe Potential Using Atomic Sensors on Graphene[J]. ACS Nano,2016,10(12):10698-10705.
APA
Zhao, Yue.,Wyrick, Jonathan.,Natterer, Fabian D..,Watanabe, Kenji.,Taniguchi, Takashi.,...&Stroscio, Joseph A..(2016).Tomography of a Probe Potential Using Atomic Sensors on Graphene.ACS Nano,10(12),10698-10705.
MLA
Zhao, Yue,et al."Tomography of a Probe Potential Using Atomic Sensors on Graphene".ACS Nano 10.12(2016):10698-10705.
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