题名 | Tomography of a Probe Potential Using Atomic Sensors on Graphene |
作者 | |
通讯作者 | Stroscio, Joseph A. |
发表日期 | 2016-12
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DOI | |
发表期刊 | |
ISSN | 1936-0851
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EISSN | 1936-086X
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卷号 | 10期号:12页码:10698-10705 |
摘要 | Our ability to access and explore the quantum world has been greatly advanced by the power of atomic manipulation and local spectroscopy with scanning tunneling and atomic force microscopes, where the key technique is the use of atomically sharp probe tips to interact with an underlying substrate. Here we employ atomic manipulation to modify and quantify the interaction between the probe and the system under study that can strongly affect any measurement in low charge density systems, such as graphene. We transfer Co atoms from a graphene surface onto a probe tip to change and control the probe's physical structure, enabling us to modify the induced potential at a graphene surface. We utilize single Co atoms on a graphene field-effect device as atomic scale sensors to quantitatively map the modified potential exerted by the scanning probe over the whole relevant spatial and energy range. |
关键词 | |
相关链接 | [来源记录] |
收录类别 | |
语种 | 英语
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重要成果 | NI期刊
|
学校署名 | 其他
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资助项目 | National Institute of Standards and Technology Center for Nanoscale Science and Technology[70NANB10H193]
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WOS研究方向 | Chemistry
; Science & Technology - Other Topics
; Materials Science
|
WOS类目 | Chemistry, Multidisciplinary
; Chemistry, Physical
; Nanoscience & Nanotechnology
; Materials Science, Multidisciplinary
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WOS记录号 | WOS:000391079700012
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出版者 | |
EI入藏号 | 20170103222822
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EI主题词 | Atomic Force Microscopy
; Cobalt
; Screening
|
EI分类号 | Nonferrous Metals And Alloys Excluding Alkali And Alkaline Earth Metals:549.3
; Optical Devices And Systems:741.3
; Nanotechnology:761
; Chemical Operations:802.3
; Chemical Products Generally:804
|
来源库 | Web of Science
|
引用统计 |
被引频次[WOS]:12
|
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/29354 |
专题 | 理学院_物理系 |
作者单位 | 1.NIST, Ctr Nanoscale Sci & Technol, Gaithersburg, MD 20899 USA 2.Univ Maryland, Maryland NanoCtr, College Pk, MD 20742 USA 3.South Univ Sci & Technol China, Dept Phys, Shenzhen 518055, Peoples R China 4.Natl Inst Mat Sci, Adv Mat Lab, Tsukuba, Ibaraki 3050044, Japan |
第一作者单位 | 物理系 |
推荐引用方式 GB/T 7714 |
Zhao, Yue,Wyrick, Jonathan,Natterer, Fabian D.,et al. Tomography of a Probe Potential Using Atomic Sensors on Graphene[J]. ACS Nano,2016,10(12):10698-10705.
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APA |
Zhao, Yue.,Wyrick, Jonathan.,Natterer, Fabian D..,Watanabe, Kenji.,Taniguchi, Takashi.,...&Stroscio, Joseph A..(2016).Tomography of a Probe Potential Using Atomic Sensors on Graphene.ACS Nano,10(12),10698-10705.
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MLA |
Zhao, Yue,et al."Tomography of a Probe Potential Using Atomic Sensors on Graphene".ACS Nano 10.12(2016):10698-10705.
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条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | 操作 | |
Wyrick-2016-Tomograp(1734KB) | -- | -- | 限制开放 | -- |
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