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题名

He plasma treatment of transparent conductive ZnO thin films

作者
通讯作者Chen, Shuming
发表日期
2015-11-15
DOI
发表期刊
ISSN
0169-4332
EISSN
1873-5584
卷号355页码:702-705
摘要
The electrical resistivity, structure, and composition and work function of ZnO thin films deposited by sputtering and post-treated with He plasma were studied. First, the treating effects of ZnO films by He, Ar and H-2 plasmas were compared. The electrical resistivity depended on the treated type of plasmas, the treated powers and times, and the thickness of film. The Ar plasma has the highest ion moment energy to disrupt the Zn-O bonding during treatment. The injection of H in ZnO can also act as the shallow donors to decrease the resistivity besides by desorption of weakly bonded oxygen species. The H-2 and He plasmas have the etching effects on the surface of ZnO films at higher power and time. For the ZnO films before and after optimized He plasma treating, the electrical resistivity decreased from 104 to 7.0 x 10(-3) Omega cm, the carrier concentration increased from 7.0 x 10(15) to 1.8 x 10(2)degrees cm(-3), and the interstitial Zn and 0 vacancy deficiencies increased from 29.1 to 58.7% and 52.1 to 71.4%, and the work functions reduced from 8.5 to 7.6 eV, but with no significant change of crystal structure. (C) 2015 Elsevier B.V. All rights reserved.
关键词
相关链接[来源记录]
收录类别
SCI ; EI
语种
英语
学校署名
第一 ; 通讯
资助项目
Special Support Program of Guangdong Province[2014TQ01X015]
WOS研究方向
Chemistry ; Materials Science ; Physics
WOS类目
Chemistry, Physical ; Materials Science, Coatings & Films ; Physics, Applied ; Physics, Condensed Matter
WOS记录号
WOS:000363815700095
出版者
EI入藏号
20154201414588
EI主题词
Argon ; Carrier concentration ; Conductive films ; Crystal structure ; Electric conductivity ; Etching ; Helium ; II-VI semiconductors ; Metallic films ; Optical films ; Plasma applications ; Work function ; Zinc oxide
EI分类号
Electricity: Basic Concepts and Phenomena:701.1 ; Conducting Materials:708.2 ; Optical Devices and Systems:741.3 ; Chemical Reactions:802.2 ; Chemical Products Generally:804 ; Inorganic Compounds:804.2 ; Atomic and Molecular Physics:931.3 ; Plasma Physics:932.3 ; Crystal Lattice:933.1.1
ESI学科分类
MATERIALS SCIENCE
来源库
Web of Science
引用统计
被引频次[WOS]:6
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/29885
专题工学院_电子与电气工程系
作者单位
1.South Univ Sci & Technol China, Dept Elect & Elect Engn, Shenzhen 518055, Guangdong, Peoples R China
2.Hong Kong Univ Sci & Technol, Dept Elect & Comp Engn, Kowloon, Hong Kong, Peoples R China
第一作者单位电子与电气工程系
通讯作者单位电子与电气工程系
第一作者的第一单位电子与电气工程系
推荐引用方式
GB/T 7714
Yao, Jian Ke,Chen, Shuming,Sun, Xiao Wei,et al. He plasma treatment of transparent conductive ZnO thin films[J]. APPLIED SURFACE SCIENCE,2015,355:702-705.
APA
Yao, Jian Ke,Chen, Shuming,Sun, Xiao Wei,&Kwok, Hoi Sing.(2015).He plasma treatment of transparent conductive ZnO thin films.APPLIED SURFACE SCIENCE,355,702-705.
MLA
Yao, Jian Ke,et al."He plasma treatment of transparent conductive ZnO thin films".APPLIED SURFACE SCIENCE 355(2015):702-705.
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