题名 | He plasma treatment of transparent conductive ZnO thin films |
作者 | |
通讯作者 | Chen, Shuming |
发表日期 | 2015-11-15
|
DOI | |
发表期刊 | |
ISSN | 0169-4332
|
EISSN | 1873-5584
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卷号 | 355页码:702-705 |
摘要 | The electrical resistivity, structure, and composition and work function of ZnO thin films deposited by sputtering and post-treated with He plasma were studied. First, the treating effects of ZnO films by He, Ar and H-2 plasmas were compared. The electrical resistivity depended on the treated type of plasmas, the treated powers and times, and the thickness of film. The Ar plasma has the highest ion moment energy to disrupt the Zn-O bonding during treatment. The injection of H in ZnO can also act as the shallow donors to decrease the resistivity besides by desorption of weakly bonded oxygen species. The H-2 and He plasmas have the etching effects on the surface of ZnO films at higher power and time. For the ZnO films before and after optimized He plasma treating, the electrical resistivity decreased from 104 to 7.0 x 10(-3) Omega cm, the carrier concentration increased from 7.0 x 10(15) to 1.8 x 10(2)degrees cm(-3), and the interstitial Zn and 0 vacancy deficiencies increased from 29.1 to 58.7% and 52.1 to 71.4%, and the work functions reduced from 8.5 to 7.6 eV, but with no significant change of crystal structure. (C) 2015 Elsevier B.V. All rights reserved. |
关键词 | |
相关链接 | [来源记录] |
收录类别 | |
语种 | 英语
|
学校署名 | 第一
; 通讯
|
资助项目 | Special Support Program of Guangdong Province[2014TQ01X015]
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WOS研究方向 | Chemistry
; Materials Science
; Physics
|
WOS类目 | Chemistry, Physical
; Materials Science, Coatings & Films
; Physics, Applied
; Physics, Condensed Matter
|
WOS记录号 | WOS:000363815700095
|
出版者 | |
EI入藏号 | 20154201414588
|
EI主题词 | Argon
; Carrier concentration
; Conductive films
; Crystal structure
; Electric conductivity
; Etching
; Helium
; II-VI semiconductors
; Metallic films
; Optical films
; Plasma applications
; Work function
; Zinc oxide
|
EI分类号 | Electricity: Basic Concepts and Phenomena:701.1
; Conducting Materials:708.2
; Optical Devices and Systems:741.3
; Chemical Reactions:802.2
; Chemical Products Generally:804
; Inorganic Compounds:804.2
; Atomic and Molecular Physics:931.3
; Plasma Physics:932.3
; Crystal Lattice:933.1.1
|
ESI学科分类 | MATERIALS SCIENCE
|
来源库 | Web of Science
|
引用统计 |
被引频次[WOS]:6
|
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/29885 |
专题 | 工学院_电子与电气工程系 |
作者单位 | 1.South Univ Sci & Technol China, Dept Elect & Elect Engn, Shenzhen 518055, Guangdong, Peoples R China 2.Hong Kong Univ Sci & Technol, Dept Elect & Comp Engn, Kowloon, Hong Kong, Peoples R China |
第一作者单位 | 电子与电气工程系 |
通讯作者单位 | 电子与电气工程系 |
第一作者的第一单位 | 电子与电气工程系 |
推荐引用方式 GB/T 7714 |
Yao, Jian Ke,Chen, Shuming,Sun, Xiao Wei,et al. He plasma treatment of transparent conductive ZnO thin films[J]. APPLIED SURFACE SCIENCE,2015,355:702-705.
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APA |
Yao, Jian Ke,Chen, Shuming,Sun, Xiao Wei,&Kwok, Hoi Sing.(2015).He plasma treatment of transparent conductive ZnO thin films.APPLIED SURFACE SCIENCE,355,702-705.
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MLA |
Yao, Jian Ke,et al."He plasma treatment of transparent conductive ZnO thin films".APPLIED SURFACE SCIENCE 355(2015):702-705.
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条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | 操作 | |
Yao-2015-He plasma t(466KB) | -- | -- | 限制开放 | -- |
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