中文版 | English
题名

Advanced electron microscopy for thermoelectric materials

作者
通讯作者He, Jiaqing
发表日期
2015-04
DOI
发表期刊
ISSN
2211-2855
EISSN
2211-3282
卷号13页码:626-650
摘要
Thermoelectric (TE) materials can interconvert waste heat into electricity, thus are promising for power generation and solid-state refrigeration. The thermoelectric properties of a certain material strongly correlate with its chemical, structural and electronic features; therefore, a thorough characterization of these features is not only crucial to profoundly understand the material itself, but also helps to design new materials with desired properties. Under this circumstance, various electron microscopy (EM) techniques are developed, from micro-scale to atomic-scale, two-dimensional (2-D) to 3-D, and static to dynamic. In this review, we review advanced EM techniques already applied in and also look into the perspective of introducing more EM techniques into the field of thermo-electrics. Specifically, we firstly summarize "what have been done" involving: structural and chemical characterizations of all-scale "imperfectness", electronic structure investigation, 3-D morphology and dynamic evolution of nanostructures, and atomic-scale mapping of Seebeck coefficient and defects; based on these characterized features, we then briefly review the calculations on electrical and thermal transport properties to illustrate the structure-property correlations. In what follows, we propose "what can be done" in TEs via EM techniques including: valence-electron distribution, quantitative measurement of atomic displacement, point defect characterization, local band gap measurement, phonon excitation detection, electrostatic potential determination, thermal stability of nanostructures, and in-situ observation and measurement of local TE effects. (C) 2015 Elsevier Ltd. All rights reserved.
关键词
相关链接[来源记录]
收录类别
SCI ; EI
语种
英语
学校署名
第一
资助项目
Science, Technology and Innovation Commission of Shenzhen Municipality[JCYJ20140612140151884]
WOS研究方向
Chemistry ; Science & Technology - Other Topics ; Materials Science ; Physics
WOS类目
Chemistry, Physical ; Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied
WOS记录号
WOS:000358414700067
出版者
EI入藏号
20151700785802
EI主题词
Atoms ; Defects ; Electron microscopes ; Electron microscopy ; Electronic structure ; Electrons ; Energy gap ; Nanostructures ; Thermodynamic stability ; Thermoelectric equipment ; Thermoelectricity ; Waste heat
EI分类号
Energy Losses (industrial and residential):525.4 ; Thermoelectric Energy:615.4 ; Thermodynamics:641.1 ; Electricity: Basic Concepts and Phenomena:701.1 ; Nanotechnology:761 ; Atomic and Molecular Physics:931.3 ; Solid State Physics:933 ; Materials Science:951
来源库
Web of Science
引用统计
被引频次[WOS]:79
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/30010
专题理学院_物理系
作者单位
1.South Univ Sci & Technol China, Dept Phys, Shenzhen 518055, Peoples R China
2.Shenzhen Key Lab Thermoelect Mat, Shenzhen 518055, Peoples R China
第一作者单位物理系
第一作者的第一单位物理系
推荐引用方式
GB/T 7714
Wu, Haijun,Zheng, Fengshan,Wu, Di,et al. Advanced electron microscopy for thermoelectric materials[J]. Nano Energy,2015,13:626-650.
APA
Wu, Haijun,Zheng, Fengshan,Wu, Di,Ge, Zhen-Hua,Liu, Xiaoye,&He, Jiaqing.(2015).Advanced electron microscopy for thermoelectric materials.Nano Energy,13,626-650.
MLA
Wu, Haijun,et al."Advanced electron microscopy for thermoelectric materials".Nano Energy 13(2015):626-650.
条目包含的文件
文件名称/大小 文献类型 版本类型 开放类型 使用许可 操作
Wu-2015-Advanced ele(18207KB)----限制开放--
个性服务
原文链接
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
导出为Excel格式
导出为Csv格式
Altmetrics Score
谷歌学术
谷歌学术中相似的文章
[Wu, Haijun]的文章
[Zheng, Fengshan]的文章
[Wu, Di]的文章
百度学术
百度学术中相似的文章
[Wu, Haijun]的文章
[Zheng, Fengshan]的文章
[Wu, Di]的文章
必应学术
必应学术中相似的文章
[Wu, Haijun]的文章
[Zheng, Fengshan]的文章
[Wu, Di]的文章
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
[发表评论/异议/意见]
暂无评论

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。