题名 | Advanced electron microscopy for thermoelectric materials |
作者 | |
通讯作者 | He, Jiaqing |
发表日期 | 2015-04
|
DOI | |
发表期刊 | |
ISSN | 2211-2855
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EISSN | 2211-3282
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卷号 | 13页码:626-650 |
摘要 | Thermoelectric (TE) materials can interconvert waste heat into electricity, thus are promising for power generation and solid-state refrigeration. The thermoelectric properties of a certain material strongly correlate with its chemical, structural and electronic features; therefore, a thorough characterization of these features is not only crucial to profoundly understand the material itself, but also helps to design new materials with desired properties. Under this circumstance, various electron microscopy (EM) techniques are developed, from micro-scale to atomic-scale, two-dimensional (2-D) to 3-D, and static to dynamic. In this review, we review advanced EM techniques already applied in and also look into the perspective of introducing more EM techniques into the field of thermo-electrics. Specifically, we firstly summarize "what have been done" involving: structural and chemical characterizations of all-scale "imperfectness", electronic structure investigation, 3-D morphology and dynamic evolution of nanostructures, and atomic-scale mapping of Seebeck coefficient and defects; based on these characterized features, we then briefly review the calculations on electrical and thermal transport properties to illustrate the structure-property correlations. In what follows, we propose "what can be done" in TEs via EM techniques including: valence-electron distribution, quantitative measurement of atomic displacement, point defect characterization, local band gap measurement, phonon excitation detection, electrostatic potential determination, thermal stability of nanostructures, and in-situ observation and measurement of local TE effects. (C) 2015 Elsevier Ltd. All rights reserved. |
关键词 | |
相关链接 | [来源记录] |
收录类别 | |
语种 | 英语
|
学校署名 | 第一
|
资助项目 | Science, Technology and Innovation Commission of Shenzhen Municipality[JCYJ20140612140151884]
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WOS研究方向 | Chemistry
; Science & Technology - Other Topics
; Materials Science
; Physics
|
WOS类目 | Chemistry, Physical
; Nanoscience & Nanotechnology
; Materials Science, Multidisciplinary
; Physics, Applied
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WOS记录号 | WOS:000358414700067
|
出版者 | |
EI入藏号 | 20151700785802
|
EI主题词 | Atoms
; Defects
; Electron microscopes
; Electron microscopy
; Electronic structure
; Electrons
; Energy gap
; Nanostructures
; Thermodynamic stability
; Thermoelectric equipment
; Thermoelectricity
; Waste heat
|
EI分类号 | Energy Losses (industrial and residential):525.4
; Thermoelectric Energy:615.4
; Thermodynamics:641.1
; Electricity: Basic Concepts and Phenomena:701.1
; Nanotechnology:761
; Atomic and Molecular Physics:931.3
; Solid State Physics:933
; Materials Science:951
|
来源库 | Web of Science
|
引用统计 |
被引频次[WOS]:79
|
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/30010 |
专题 | 理学院_物理系 |
作者单位 | 1.South Univ Sci & Technol China, Dept Phys, Shenzhen 518055, Peoples R China 2.Shenzhen Key Lab Thermoelect Mat, Shenzhen 518055, Peoples R China |
第一作者单位 | 物理系 |
第一作者的第一单位 | 物理系 |
推荐引用方式 GB/T 7714 |
Wu, Haijun,Zheng, Fengshan,Wu, Di,et al. Advanced electron microscopy for thermoelectric materials[J]. Nano Energy,2015,13:626-650.
|
APA |
Wu, Haijun,Zheng, Fengshan,Wu, Di,Ge, Zhen-Hua,Liu, Xiaoye,&He, Jiaqing.(2015).Advanced electron microscopy for thermoelectric materials.Nano Energy,13,626-650.
|
MLA |
Wu, Haijun,et al."Advanced electron microscopy for thermoelectric materials".Nano Energy 13(2015):626-650.
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条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | 操作 | |
Wu-2015-Advanced ele(18207KB) | -- | -- | 限制开放 | -- |
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