题名 | Doping induces large variation in the electrical properties of MoS2 monolayers |
作者 | |
通讯作者 | Xiong, Hao D. |
发表日期 | 2015-04
|
DOI | |
发表期刊 | |
ISSN | 0038-1101
|
EISSN | 1879-2405
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卷号 | 106页码:44-49 |
摘要 | As the devices are being shrunk into nanoscale, it is increasingly difficult, if not impossible, to precisely control the dopant position and number in low-dimensional nanomaterials. In this work, we have investigated doping effect on the electrical properties of n-type and p-type MoS2 monolayer, one of the representative two-dimensional layered semiconductors. We found that the sheet resistance of a nanoscale MoS2 monolayer exhibited large variation (>35%) as the dopant number or position changes, although the variation in band gap is relatively small. The variation increases as the size of MoS2 monolayer decreases. This variation in the doped MoS2 monolayer nanoribbons seems inevitable and will cause significant device-to-device variation that the integrated circuit cannot tolerate. This study also suggests that these two-dimensional semiconductors should be protected from unintentional or intentional doping if they are used in the transistors in future integrated circuits. (C) 2015 Elsevier Ltd. All rights reserved. |
关键词 | |
相关链接 | [来源记录] |
收录类别 | |
语种 | 英语
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学校署名 | 通讯
|
资助项目 | U.S. NIST[60NANB11D148]
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WOS研究方向 | Engineering
; Physics
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WOS类目 | Engineering, Electrical & Electronic
; Physics, Applied
; Physics, Condensed Matter
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WOS记录号 | WOS:000352747100006
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出版者 | |
EI入藏号 | 20150600484986
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EI主题词 | Doping (additives)
; Energy gap
; Integrated circuits
; Layered semiconductors
; Molybdenum compounds
; Monolayers
; Nanostructured materials
; Semiconductor doping
; Semiconductor materials
|
EI分类号 | Semiconducting Materials:712.1
; Semiconductor Devices and Integrated Circuits:714.2
; Nanotechnology:761
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ESI学科分类 | PHYSICS
|
来源库 | Web of Science
|
引用统计 |
被引频次[WOS]:17
|
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/30014 |
专题 | 工学院_电子与电气工程系 |
作者单位 | 1.George Mason Univ, Dept Elect & Comp Engn, Fairfax, VA 22030 USA 2.South Univ Sci & Technol China, Dept Elect & Elect Engn, Shenzhen, Peoples R China |
通讯作者单位 | 电子与电气工程系 |
推荐引用方式 GB/T 7714 |
Eshun, Kwesi,Xiong, Hao D.,Yu, Sheng,et al. Doping induces large variation in the electrical properties of MoS2 monolayers[J]. SOLID-STATE ELECTRONICS,2015,106:44-49.
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APA |
Eshun, Kwesi,Xiong, Hao D.,Yu, Sheng,&Li, Qiliang.(2015).Doping induces large variation in the electrical properties of MoS2 monolayers.SOLID-STATE ELECTRONICS,106,44-49.
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MLA |
Eshun, Kwesi,et al."Doping induces large variation in the electrical properties of MoS2 monolayers".SOLID-STATE ELECTRONICS 106(2015):44-49.
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条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | 操作 | |
Eshun-2015-Doping in(2283KB) | -- | -- | 限制开放 | -- |
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