题名 | p-GaN Gate HEMTs With 10.6 V Maximum Gate Drive Voltages by Mg Doping Engineering |
作者 | |
通讯作者 | Xia, Guangrui; Yu, Hongyu |
发表日期 | 2022-05
|
DOI | |
发表期刊 | |
ISSN | 1557-9646
|
卷号 | 69期号:5页码:2282-2286 |
关键词 | |
相关链接 | [IEEE记录] |
收录类别 | |
学校署名 | 第一
; 通讯
|
WOS记录号 | WOS:000770588000001
|
EI入藏号 | 20221211832332
|
EI主题词 | Aluminum gallium nitride
; Failure analysis
; Gallium nitride
; High electron mobility transistors
; Hole concentration
; III-V semiconductors
; Leakage currents
; Magnesium
; Metallorganic chemical vapor deposition
; Organic chemicals
; Organometallics
; Secondary ion mass spectrometry
; Temperature measurement
; Threshold voltage
|
EI分类号 | Magnesium and Alloys:542.2
; Alkaline Earth Metals:549.2
; Electricity: Basic Concepts and Phenomena:701.1
; Semiconducting Materials:712.1
; Semiconductor Devices and Integrated Circuits:714.2
; Chemical Reactions:802.2
; Organic Compounds:804.1
; Inorganic Compounds:804.2
; Temperature Measurements:944.6
|
ESI学科分类 | ENGINEERING
|
来源库 | IEEE
|
全文链接 | https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9737317 |
引用统计 |
被引频次[WOS]:15
|
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/313165 |
专题 | 工学院_深港微电子学院 |
作者单位 | 1.Southern Univ Sci & Technol SUSTech, Sch Microelect, Shenzhen 518055, Guangdong, Peoples R China 2.Univ British Columbia UBC, Dept Mat Engn, Vancouver, BC V6T 1Z4, Canada 3.Southern Univ Sci & Technol SUSTech, Engn Res Ctr Integrated Circuits Next Generat Com, Shenzhen Inst Wide Bandgap Semicond, Minist Educ,Sch Microelect, Shenzhen 518055, Guangdong, Peoples R China 4.Southern Univ Sci & Technol SUSTech, GaN Device Engn Technol Res Ctr Guangdong, Shenzhen 518055, Guangdong, Peoples R China 5.Enkris Semicond Inc, Suzhou 215123, Peoples R China |
第一作者单位 | 深港微电子学院 |
通讯作者单位 | 深港微电子学院; 南方科技大学 |
第一作者的第一单位 | 深港微电子学院 |
推荐引用方式 GB/T 7714 |
Zhou, Guangnan,Zeng, Fanming,Gao, Rongyu,et al. p-GaN Gate HEMTs With 10.6 V Maximum Gate Drive Voltages by Mg Doping Engineering[J]. IEEE Transactions on Electron Devices,2022,69(5):2282-2286.
|
APA |
Zhou, Guangnan.,Zeng, Fanming.,Gao, Rongyu.,Wang, Qing.,Cheng, Kai.,...&Yu, Hongyu.(2022).p-GaN Gate HEMTs With 10.6 V Maximum Gate Drive Voltages by Mg Doping Engineering.IEEE Transactions on Electron Devices,69(5),2282-2286.
|
MLA |
Zhou, Guangnan,et al."p-GaN Gate HEMTs With 10.6 V Maximum Gate Drive Voltages by Mg Doping Engineering".IEEE Transactions on Electron Devices 69.5(2022):2282-2286.
|
条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | 操作 | |
p-GaN_Gate_HEMTs_Wit(3084KB) | -- | -- | 限制开放 | -- |
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