Monitoring the Material Quality of Two-Dimensional Transition Metal Dichalcogenides

Wang，Jinhuan1; Huang，Chen2; You，Yilong2; Guo，Quanlin2; Xue，Guodong2; Hong，Hao2; Jiao，Qingze1; Yu，Dapeng4; Du，Lena4,5; Zhao，Yun1; Liu，Kaihui2,3

2022-03-03

10.1021/acs.jpcc.2c00051

Journal of Physical Chemistry C   影响因子和分区

1932-7447

1932-7455

Two-dimensional (2D) transition metal dichalcogenides (TMDs), with atomic thickness, strong spin-orbit coupling, enhanced light-matter interactions. and facile quantum control ability, have demonstrated great potential in the applications of nanoelectronics and optoelectronics. The realization of these high-performance applications strongly relies on the production of large-scale TMD films with high quality. Therefore, facile and accurate quality monitoring of TMDs is essential for their future applications. In this Review, we summarized the main defect types in TMD crystals obtained by different synthesis methods, and we discussed recent cutting-edge characterization techniques, including scanning transmission electron microscopy, etching or adsorption, optical spectroscopy, and field-effect transistors. Finally, we provide a short perspective on the future development of quality monitoring techniques for broad 2D materials.

SCI ; EI

英语

通讯

Key R&D Program of Guangdong Province["2019B010931001","2020B010189001","2018B030327001"] ; National Natural Science Foundation of China[92163206,52025023,51991342,52021006,51991344,52100115,11888101] ; China Postdoctoral Science Foundation[2021T140022] ; Strategic Priority Research Program of the Chinese Academy of Sciences[XDB33000000] ; Beijing Natural Science Foundation[JQ19004] ; Pearl River Talent Recruitment Program of Guangdong Province[2019ZT08C321]

Chemistry ; Science & Technology - Other Topics ; Materials Science

Chemistry, Physical ; Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary

WOS:000773651500001

AMER CHEMICAL SOC

20220911729750

Etching ; Field effect transistors ; High resolution transmission electron microscopy ; Scanning electron microscopy

Metallurgy and Metallography:531 ; Semiconductor Devices and Integrated Circuits:714.2 ; Optical Devices and Systems:741.3 ; Chemical Reactions:802.2

2-s2.0-85125411568

Scopus

1.School of Chemistry and Chemical Engineering,Beijing Institute of Technology,Beijing,102488,China
2.State Key Laboratory for Mesoscopic Physics,Frontiers Science Centre for Nano-optoelectronics,School of Physics,Peking University,Beijing,100871,China
3.Songshan Lake Materials Laboratory,Institute of Physics,Chinese Academy of Sciences,Dongguan,523808,China
4.Shenzhen Institute for Quantum Science and Engineering,and Department of Physics,Southern University of Science and Technology,Shenzhen,518055,China
5.Department of Physics,Capital Normal University,Beijing,100037,China

Wang，Jinhuan,Huang，Chen,You，Yilong,et al. Monitoring the Material Quality of Two-Dimensional Transition Metal Dichalcogenides[J]. Journal of Physical Chemistry C,2022,126(8):3797-3810.

Wang，Jinhuan.,Huang，Chen.,You，Yilong.,Guo，Quanlin.,Xue，Guodong.,...&Liu，Kaihui.(2022).Monitoring the Material Quality of Two-Dimensional Transition Metal Dichalcogenides.Journal of Physical Chemistry C,126(8),3797-3810.

Wang，Jinhuan,et al."Monitoring the Material Quality of Two-Dimensional Transition Metal Dichalcogenides".Journal of Physical Chemistry C 126.8(2022):3797-3810.