题名 | Multi-modality Large Deformation Diffeomorphic Metric Mapping Driven by Single-modality Images |
作者 | |
通讯作者 | Wu,Jiong; Tang,Xiaoying |
DOI | |
发表日期 | 2021
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会议名称 | 43rd Annual International Conference of the IEEE-Engineering-in-Medicine-and-Biology-Society (IEEE EMBC)
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ISSN | 1557-170X
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EISSN | 1558-4615
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ISBN | 978-1-7281-1180-3
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会议录名称 | |
页码 | 2610-2613
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会议日期 | NOV 01-05, 2021
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会议地点 | null,null,ELECTR NETWORK
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出版地 | 345 E 47TH ST, NEW YORK, NY 10017 USA
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出版者 | |
摘要 | Multi-modality magnetic resonance image (MRI) registration is an essential step in various MRI analysis tasks. However, it is challenging to have all required modalities in clinical practice, and thus the application of multi-modality registration is limited. This paper tackles such problem by proposing a novel unsupervised deep learning based multi-modality large deformation diffeomorphic metric mapping (LDDMM) framework which is capable of performing multi-modality registration only using single-modality MRIs. Specifically, an unsupervised image-to-image translation model is trained and used to synthesize the missing modality MRIs from the available ones. Multi-modality LDDMM is then performed in a multi-channel manner. Experimental results obtained on one publicly- accessible datasets confirm the superior performance of the proposed approach.Clinical relevance - This work provides a tool for multi-modality MRI registration with solely single-modality images, which addresses the very common issue of missing modalities in clinical practice. |
关键词 | |
学校署名 | 通讯
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语种 | 英语
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相关链接 | [Scopus记录] |
收录类别 | |
资助项目 | National Natural Science Foundation of China[62071210];
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WOS研究方向 | Engineering
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WOS类目 | Engineering, Biomedical
; Engineering, Electrical & Electronic
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WOS记录号 | WOS:000760910502118
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EI入藏号 | 20220811670348
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Scopus记录号 | 2-s2.0-85122491941
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来源库 | Scopus
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全文链接 | https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9630617 |
引用统计 |
被引频次[WOS]:4
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成果类型 | 会议论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/328188 |
专题 | 工学院_电子与电气工程系 |
作者单位 | 1.Hunan University of Arts and Science,School of Computer and Electrical Engineering,Hunan,China 2.Hunan University of Arts and Science,Furong College,Hunan,China 3.Sun Yat-sen University,School of Electronics and Information Technology,Guangzhou,China 4.Southern University of Science and Technology,Department of Electrical and Electronic Engineering,Shenzhen,China 5.Department of Electrical and Electronic Engineering,The University of Hong Kong,Hong Kong,Hong Kong |
通讯作者单位 | 电子与电气工程系 |
推荐引用方式 GB/T 7714 |
Wu,Jiong,Zhou,Shuang,Yang,Qi,et al. Multi-modality Large Deformation Diffeomorphic Metric Mapping Driven by Single-modality Images[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2021:2610-2613.
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条目包含的文件 | 条目无相关文件。 |
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