题名 | Bridging the gap between atomically thin semiconductors and metal leads |
作者 | |
通讯作者 | Wang,Ning |
发表日期 | 2022-12-01
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DOI | |
发表期刊 | |
EISSN | 2041-1723
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卷号 | 13期号:1 |
摘要 | Electrically interfacing atomically thin transition metal dichalcogenide semiconductors (TMDSCs) with metal leads is challenging because of undesired interface barriers, which have drastically constrained the electrical performance of TMDSC devices for exploring their unconventional physical properties and realizing potential electronic applications. Here we demonstrate a strategy to achieve nearly barrier-free electrical contacts with few-layer TMDSCs by engineering interfacial bonding distortion. The carrier-injection efficiency of such electrical junction is substantially increased with robust ohmic behaviors from room to cryogenic temperatures. The performance enhancements of TMDSC field-effect transistors are well reflected by the low contact resistance (down to 90 Ωµm in MoS, towards the quantum limit), the high field-effect mobility (up to 358,000 cmVs in WSe), and the prominent transport characteristics at cryogenic temperatures. This method also offers possibilities of the local manipulation of atomic structures and electronic properties for TMDSC device design. |
相关链接 | [Scopus记录] |
收录类别 | |
语种 | 英语
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重要成果 | NI论文
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学校署名 | 其他
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资助项目 | Research Grants Council, University Grants Committee[16303720];Research Grants Council, University Grants Committee[AoE/P-701/20];Research Grants Council, University Grants Committee[C6025-19G];Research Grants Council, University Grants Committee[C7036-17W];
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WOS研究方向 | Science & Technology - Other Topics
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WOS类目 | Multidisciplinary Sciences
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WOS记录号 | WOS:000777408600017
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出版者 | |
Scopus记录号 | 2-s2.0-85127451108
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来源库 | Scopus
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引用统计 |
被引频次[WOS]:30
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成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/329557 |
专题 | 工学院_材料科学与工程系 工学院_电子与电气工程系 |
作者单位 | 1.Department of Physics and Center for Quantum Materials,The Hong Kong University of Science and Technology,Clear Water Bay,Kowloon,Hong Kong 2.Department of Chemistry,The Hong Kong University of Science and Technology,Clear Water Bay,Kowloon,Hong Kong 3.Department of Materials Science and Engineering,Southern University of Science and Technology,Shenzhen,518055,China 4.Department of Electrical and Electronic Engineering,Southern University of Science and Technology,Shenzhen,518055,China |
推荐引用方式 GB/T 7714 |
Cai,Xiangbin,Wu,Zefei,Han,Xu,et al. Bridging the gap between atomically thin semiconductors and metal leads[J]. Nature Communications,2022,13(1).
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APA |
Cai,Xiangbin.,Wu,Zefei.,Han,Xu.,Chen,Yong.,Xu,Shuigang.,...&Wang,Ning.(2022).Bridging the gap between atomically thin semiconductors and metal leads.Nature Communications,13(1).
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MLA |
Cai,Xiangbin,et al."Bridging the gap between atomically thin semiconductors and metal leads".Nature Communications 13.1(2022).
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条目包含的文件 | 条目无相关文件。 |
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