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题名

Spatial modulation of nanopattern dimensions by combining interference lithography and grayscale-patterned secondary exposure

作者
发表日期
2022-12-01
DOI
发表期刊
ISSN
2095-5545
EISSN
2047-7538
卷号11期号:1
摘要
Functional nanostructures are exploited for a variety of cutting-edge fields including plasmonics, metasurfaces, and biosensors, just to name a few. Some applications require nanostructures with uniform feature sizes while others rely on spatially varying morphologies. However, fine manipulation of the feature size over a large area remains a substantial challenge because mainstream approaches to precise nanopatterning are based on low-throughput pixel-by-pixel processing, such as those utilizing focused beams of photons, electrons, or ions. In this work, we provide a solution toward wafer-scale, arbitrary modulation of feature size distribution by introducing a lithographic portfolio combining interference lithography (IL) and grayscale-patterned secondary exposure (SE). Employed after the high-throughput IL, a SE with patterned intensity distribution spatially modulates the dimensions of photoresist nanostructures. Based on this approach, we successfully fabricated 4-inch wafer-scale nanogratings with uniform linewidths of <5% variation, using grayscale-patterned SE to compensate for the linewidth difference caused by the Gaussian distribution of the laser beams in the IL. Besides, we also demonstrated a wafer-scale structural color painting by spatially modulating the filling ratio to achieve gradient grayscale color using SE.
相关链接[Scopus记录]
收录类别
SCI ; EI
语种
英语
学校署名
其他
资助项目
Research Grants Council, University Grants Committee[17207419];Research Grants Council, University Grants Committee[17209320];University of Hong Kong[202010160046];University of Hong Kong[202011159235];Research Grants Council, University Grants Committee[AoE/P-701/20];Research Grants Council, University Grants Committee[C7018-20G];Science, Technology and Innovation Commission of Shenzhen Municipality[K20799112];
WOS研究方向
Optics
WOS类目
Optics
WOS记录号
WOS:000781365500001
出版者
EI入藏号
20221611963897
EI主题词
Gaussian beams ; Laser beams ; Modulation ; Nanostructures ; Pixels ; Plasmonics
EI分类号
Electromagnetic Waves:711 ; Semiconductor Devices and Integrated Circuits:714.2 ; Laser Beam Interactions:744.8 ; Nanotechnology:761 ; Coating Materials:813.2 ; Plasma Physics:932.3 ; Solid State Physics:933
Scopus记录号
2-s2.0-85127976478
来源库
Scopus
引用统计
被引频次[WOS]:18
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/331118
专题工学院_深港微电子学院
作者单位
1.Department of Mechanical Engineering,University of Hong Kong,Hong Kong
2.School of Microelectronics,Southern University of Science and Technology,Shenzhen,China
第一作者单位深港微电子学院
推荐引用方式
GB/T 7714
Gan,Zhuofei,Feng,Hongtao,Chen,Liyang,et al. Spatial modulation of nanopattern dimensions by combining interference lithography and grayscale-patterned secondary exposure[J]. Light:Science & Applications,2022,11(1).
APA
Gan,Zhuofei.,Feng,Hongtao.,Chen,Liyang.,Min,Siyi.,Liang,Chuwei.,...&Li,Wen Di.(2022).Spatial modulation of nanopattern dimensions by combining interference lithography and grayscale-patterned secondary exposure.Light:Science & Applications,11(1).
MLA
Gan,Zhuofei,et al."Spatial modulation of nanopattern dimensions by combining interference lithography and grayscale-patterned secondary exposure".Light:Science & Applications 11.1(2022).
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