题名 | Analysis of size dependence and the behavior under ultrahigh current density injection condition of GaN-based Micro-LEDs with pixel size down to 3 mu m |
作者 | |
通讯作者 | Liu, Zhaojun |
发表日期 | 2022-08-04
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DOI | |
发表期刊 | |
ISSN | 0022-3727
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EISSN | 1361-6463
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卷号 | 55期号:31 |
摘要 | In this paper, the GaN-based green micro light-emitting diodes (Micro-LEDs) with various sizes (from 3 to 100 mu m) were fabricated and electro-optically characterized. Atom layer deposition (ALD) passivation and potassium hydroxide (KOH) treatment were applied to eliminate the sidewall damage. The size dependence of Micro-LED was systematically analyzed with current-versus-voltage and current density-versus-voltage relationship. According to the favorable ideality factor results (<1.5), the optimized sidewall treatment was achieved when the device size shrank down to mu m. In addition, the external quantum efficiency (EQE) droop phenomenon, luminance and output power density characteristics were depicted up to the highest current density injection condition to date (120 kA cm(-2)), and 6 mu m device exhibited an improved EQE performance with the peak EQE value of 16.59% at 20 A cm(-2) and over 600k and 6M cd cm(-2) at 1 and 10 A cm(-2), indicating a greater brightness quality for over 3000 PPI multiple display application. Lastly, the blue shift of 6 mu m device with elevating current density was observed in electroluminescence spectra and converted to CIE 1931 color space. The whole shifting track and color variation from 1 A cm(-2) to 120 kA cm(-2) were demonstrated by color coordinates. |
关键词 | |
相关链接 | [来源记录] |
收录类别 | |
语种 | 英语
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学校署名 | 通讯
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资助项目 | Fundamental and Applied Fundamental Research Fund of Guangdong Province[2021B1515130001]
; Shenzhen Science and Technology Program[KQTD20170810110313773]
; High-level University Fund[G02236005]
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WOS研究方向 | Physics
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WOS类目 | Physics, Applied
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WOS记录号 | WOS:000797686800001
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出版者 | |
EI入藏号 | 20222212171994
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EI主题词 | Atomic layer deposition
; Electroluminescence
; Gallium nitride
; III-V semiconductors
; Light emitting diodes
; Luminance
; Potassium hydroxide
; Red Shift
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EI分类号 | Electricity: Basic Concepts and Phenomena:701.1
; Semiconducting Materials:712.1
; Semiconductor Devices and Integrated Circuits:714.2
; Light, Optics and Optical Devices:741
; Light/Optics:741.1
; Inorganic Compounds:804.2
; Coating Techniques:813.1
; Crystal Growth:933.1.2
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ESI学科分类 | PHYSICS
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来源库 | Web of Science
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引用统计 |
被引频次[WOS]:21
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成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/335180 |
专题 | 工学院_电子与电气工程系 |
作者单位 | 1.Hong Kong Univ Sci & Technol, Dept Elect & Comp Engn, Hong Kong, Peoples R China 2.Southern Univ Sci & Technol, Dept Elect & Elect Engn, Shenzhen 518055, Peoples R China 3.Shenzhen Sitan Technol Co Ltd, Shenzhen, Peoples R China |
通讯作者单位 | 电子与电气工程系 |
推荐引用方式 GB/T 7714 |
Liu, Yibo,Feng, Feng,Zhang, Ke,et al. Analysis of size dependence and the behavior under ultrahigh current density injection condition of GaN-based Micro-LEDs with pixel size down to 3 mu m[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2022,55(31).
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APA |
Liu, Yibo.,Feng, Feng.,Zhang, Ke.,Jiang, Fulong.,Chan, Ka-Wah.,...&Liu, Zhaojun.(2022).Analysis of size dependence and the behavior under ultrahigh current density injection condition of GaN-based Micro-LEDs with pixel size down to 3 mu m.JOURNAL OF PHYSICS D-APPLIED PHYSICS,55(31).
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MLA |
Liu, Yibo,et al."Analysis of size dependence and the behavior under ultrahigh current density injection condition of GaN-based Micro-LEDs with pixel size down to 3 mu m".JOURNAL OF PHYSICS D-APPLIED PHYSICS 55.31(2022).
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