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题名

Analysis of size dependence and the behavior under ultrahigh current density injection condition of GaN-based Micro-LEDs with pixel size down to 3 mu m

作者
通讯作者Liu, Zhaojun
发表日期
2022-08-04
DOI
发表期刊
ISSN
0022-3727
EISSN
1361-6463
卷号55期号:31
摘要
In this paper, the GaN-based green micro light-emitting diodes (Micro-LEDs) with various sizes (from 3 to 100 mu m) were fabricated and electro-optically characterized. Atom layer deposition (ALD) passivation and potassium hydroxide (KOH) treatment were applied to eliminate the sidewall damage. The size dependence of Micro-LED was systematically analyzed with current-versus-voltage and current density-versus-voltage relationship. According to the favorable ideality factor results (<1.5), the optimized sidewall treatment was achieved when the device size shrank down to mu m. In addition, the external quantum efficiency (EQE) droop phenomenon, luminance and output power density characteristics were depicted up to the highest current density injection condition to date (120 kA cm(-2)), and 6 mu m device exhibited an improved EQE performance with the peak EQE value of 16.59% at 20 A cm(-2) and over 600k and 6M cd cm(-2) at 1 and 10 A cm(-2), indicating a greater brightness quality for over 3000 PPI multiple display application. Lastly, the blue shift of 6 mu m device with elevating current density was observed in electroluminescence spectra and converted to CIE 1931 color space. The whole shifting track and color variation from 1 A cm(-2) to 120 kA cm(-2) were demonstrated by color coordinates.
关键词
相关链接[来源记录]
收录类别
SCI ; EI
语种
英语
学校署名
通讯
资助项目
Fundamental and Applied Fundamental Research Fund of Guangdong Province[2021B1515130001] ; Shenzhen Science and Technology Program[KQTD20170810110313773] ; High-level University Fund[G02236005]
WOS研究方向
Physics
WOS类目
Physics, Applied
WOS记录号
WOS:000797686800001
出版者
EI入藏号
20222212171994
EI主题词
Atomic layer deposition ; Electroluminescence ; Gallium nitride ; III-V semiconductors ; Light emitting diodes ; Luminance ; Potassium hydroxide ; Red Shift
EI分类号
Electricity: Basic Concepts and Phenomena:701.1 ; Semiconducting Materials:712.1 ; Semiconductor Devices and Integrated Circuits:714.2 ; Light, Optics and Optical Devices:741 ; Light/Optics:741.1 ; Inorganic Compounds:804.2 ; Coating Techniques:813.1 ; Crystal Growth:933.1.2
ESI学科分类
PHYSICS
来源库
Web of Science
引用统计
被引频次[WOS]:21
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/335180
专题工学院_电子与电气工程系
作者单位
1.Hong Kong Univ Sci & Technol, Dept Elect & Comp Engn, Hong Kong, Peoples R China
2.Southern Univ Sci & Technol, Dept Elect & Elect Engn, Shenzhen 518055, Peoples R China
3.Shenzhen Sitan Technol Co Ltd, Shenzhen, Peoples R China
通讯作者单位电子与电气工程系
推荐引用方式
GB/T 7714
Liu, Yibo,Feng, Feng,Zhang, Ke,et al. Analysis of size dependence and the behavior under ultrahigh current density injection condition of GaN-based Micro-LEDs with pixel size down to 3 mu m[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2022,55(31).
APA
Liu, Yibo.,Feng, Feng.,Zhang, Ke.,Jiang, Fulong.,Chan, Ka-Wah.,...&Liu, Zhaojun.(2022).Analysis of size dependence and the behavior under ultrahigh current density injection condition of GaN-based Micro-LEDs with pixel size down to 3 mu m.JOURNAL OF PHYSICS D-APPLIED PHYSICS,55(31).
MLA
Liu, Yibo,et al."Analysis of size dependence and the behavior under ultrahigh current density injection condition of GaN-based Micro-LEDs with pixel size down to 3 mu m".JOURNAL OF PHYSICS D-APPLIED PHYSICS 55.31(2022).
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