题名 | Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials |
作者 | |
通讯作者 | Wang, Lin; Chen, Xiaolong |
发表日期 | 2022-07-09
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DOI | |
发表期刊 | |
EISSN | 2041-1723
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卷号 | 13期号:1 |
摘要 | ["Van der Waals materials exhibit unique thermomechanical properties, but interlayer deformations are usually challenging to measure. Here, the authors exploit the strain-dependent optical properties of monolayer WSe2 to quantitatively probe the interlayer shear thermal deformations and interlayer coupling in phosphorene and hexagonal boron nitride.","Atomically-thin van der Waals layered materials, with both high in-plane stiffness and bending flexibility, offer a unique platform for thermomechanical engineering. However, the lack of effective characterization techniques hinders the development of this research topic. Here, we develop a direct experimental method and effective theoretical model to study the mechanical, thermal, and interlayer properties of van der Waals materials. This is accomplished by using a carefully designed WSe2-based heterostructure, where monolayer WSe2 serves as an in-situ strain meter. Combining experimental results and theoretical modelling, we are able to resolve the shear deformation and interlayer shear thermal deformation of each individual layer quantitatively in van der Waals materials. Our approach also provides important interlayer coupling information as well as key thermal parameters. The model can be applied to van der Waals materials with different layer numbers and various boundary conditions for both thermally-induced and mechanically-induced deformations."] |
相关链接 | [来源记录] |
收录类别 | |
语种 | 英语
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重要成果 | NI论文
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学校署名 | 第一
; 通讯
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资助项目 | open research fund of Songshan Lake Materials Laboratory[2021SLABFN02]
; National Natural Science Foundation of China["61904077","92064010","61801210","91833302"]
; National Key R&D Program of China[2020YFA0308900]
; Jiangsu Province[XYDXX-021]
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WOS研究方向 | Science & Technology - Other Topics
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WOS类目 | Multidisciplinary Sciences
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WOS记录号 | WOS:000822541400005
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出版者 | |
Scopus记录号 | 2-s2.0-85133726334
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来源库 | Web of Science
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引用统计 |
被引频次[WOS]:8
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成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/355845 |
专题 | 工学院_电子与电气工程系 |
作者单位 | 1.Southern Univ Sci & Technol, Dept Elect & Elect Engn, 1088 Xueyuan Ave, Shenzhen 518055, Peoples R China 2.Nanjing Tech Univ Nanjing Tech, Key Lab Flexible Elect KLOFE, 30 South Puzhu Rd, Nanjing 211816, Peoples R China 3.Nanjing Tech Univ Nanjing Tech, Inst Adv Mat IAM, 30 South Puzhu Rd, Nanjing 211816, Peoples R China |
第一作者单位 | 电子与电气工程系 |
通讯作者单位 | 电子与电气工程系 |
第一作者的第一单位 | 电子与电气工程系 |
推荐引用方式 GB/T 7714 |
Zhang, Le,Wang, Han,Zong, Xinrong,et al. Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials[J]. NATURE COMMUNICATIONS,2022,13(1).
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APA |
Zhang, Le.,Wang, Han.,Zong, Xinrong.,Zhou, Yongheng.,Wang, Taihong.,...&Chen, Xiaolong.(2022).Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials.NATURE COMMUNICATIONS,13(1).
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MLA |
Zhang, Le,et al."Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials".NATURE COMMUNICATIONS 13.1(2022).
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条目包含的文件 | 条目无相关文件。 |
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