南方科技大学知识苑(SUSTech KC): On-Chip Laser Voltage Probing Attack Detection with 100% Area Coverage at Above/Below the Bandgap Wavelength and Fully-Automated Design

题名	On-Chip Laser Voltage Probing Attack Detection with 100% Area Coverage at Above/Below the Bandgap Wavelength and Fully-Automated Design
作者	Zhang，Hui 1; Lin，Longyang1,2 ; Fang，Qiang 1; Alioto，Massimo 1
共同第一作者	Zhang，Hui; Lin，Longyang
DOI	10.1109/VLSITechnologyandCir46769.2022.9830144
发表日期	2022
会议名称	IEEE Symposium on VLSI Technology
ISSN	0743-1562
ISBN	978-1-6654-9773-2
会议录名称	Digest of Technical Papers - Symposium on VLSI Technology
卷号	2022-June
页码	140-141
会议日期	12-17 June 2022
会议地点	Honolulu, HI, USA
摘要	An on-chip detection scheme against Laser Voltage Probing (LVP) attacks is introduced. It enables digital IP full-area coverage, and its architecture preserves automated design and stdcell layout discipline (including restricted design rules). Stdcells with laser sensing are proposed with photocurrent sensitivity up to 4-10 pA/ m2 both above/below the bandgap wavelength, inherent PVT resilience, and no calibration.
关键词	Cryptography HW Security Laser Voltage Probing
学校署名	共同第一 ; 其他
语种	英语
相关链接	[Scopus记录]
收录类别	EI
EI入藏号	20223112528352
Scopus记录号	2-s2.0-85135242594
来源库	Scopus
全文链接	https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9830144
引用统计	被引频次[WOS]：0
成果类型	会议论文
条目标识符	http://sustech.caswiz.com/handle/2SGJ60CL/365059
专题	南方科技大学
作者单位	1.National University of Singapore,Singapore 2.Southern University of Science and Technology,Shenzhen,China
推荐引用方式 GB/T 7714	Zhang，Hui,Lin，Longyang,Fang，Qiang,et al. On-Chip Laser Voltage Probing Attack Detection with 100% Area Coverage at Above/Below the Bandgap Wavelength and Fully-Automated Design[C],2022:140-141.